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Patrick McBean

Publications and source records attributed to Patrick McBean.

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The Dublin Lens: A Cc=1.0 mm Objective Lens Intended for CryoEM at 100 keV

We have designed, fabricated and tested a lens with chromatic aberration coefficient (Cc) of 1.0 mm, a 4.0 mm pole-gap and 2.0 mm bore that is wide enough to accommodate an anti-contamination system and an objective aperture. This lens extends the temporal-coherence envelope of the electron microscope beyond 2 Angstrom, using a low-cost Schottky FEG. We hope that this lens design can be used to improve all 100 keV electron microscopes designed for single-particle electron cryomicroscopy (cryoEM).

physics.ins-det

An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy

The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used across both industry and academia, academics may hesitate to propose substantial modifications to the optical setup due to the instrument's significant purchase price, fear of voiding the service contract, or downtime being unacceptable in shared user facilities. For instruments found in industry, similarly the risk-reward balance makes substantive modifications untenable. This limits the development of radically new optical geometries, and with the performance of the TEM largely being dictated by the specification of the objective lens pole-piece, exploring novel designs may be valuable. Alternatively, potential lens designs can be analyzed rapidly and inexpensively using finite element analysis multiphysics simulation packages. Several are available, but here COMSOL Multiphysics was used, which is readily available in many universities. Changes to the geometry or materials of the lens can be investigated without any need to disassemble, reassemble, and realign the TEM column. Here we demonstrate an intuitive and accessible method to simulate charged particle optics using this 'digital twin' approach, with the hope that this encourages new creative and sustainable grassroots innovation in TEM lens design and microscope modification.

physics.ins-det

Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging

Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be corrected for in a Scanning Transmission Electron Microscope (STEM), however chromatic aberration may then dominate, limiting the ultimate resolution of the microscope. Using image simulations, we examine how a chromatic aberration corrector, different objective lenses, and different beam energy-spreads each affect the image quality of a gold nanoparticle imaged at low voltages in a spherical aberration-corrected STEM. Quantitative analysis of the simulated examples can inform the choice of instrumentation for low-voltage imaging. We here demonstrate a methodology whereby the optimum energy spread to operate a specific STEM can be deduced. This methodology can then be adapted to the specific sample and instrument of the reader, enabling them to make an informed economical choice as to what would be most beneficial for their STEM in the cost-conscious landscape of scientific infrastructure.

physics.ins-det