arXiv subjects

Pavel I. Misurkin

Publications and source records attributed to Pavel I. Misurkin.

2 recordsLinked to original sources

arXiv2010

Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the surface manufacturing process. Among these features, the surface irregularities and self-similarity structures at different spatial scales, especially in the range of 1 to 100 nm, are of high importance because they greatly affect the surface interaction forces acting at a nanoscale distance. An analytical method for parameterizing the surface irregularities and their correlations in nanosurfaces imaged by atomic force microscopy (AFM) is proposed. In this method, flicker noise spectroscopy - a statistical physics approach - is used to develop six nanometrological parameters characterizing the high-frequency contributions of jump- and spike-like irregularities into the surface texture. These contributions reflect the stochastic processes of anomalous diffusion and inertial effects, respectively, in the process of surface manufacturing. The AFM images of the texture of corrosion-resistant magnetite coatings formed on low-carbon steel in hot nitrate solutions with coating growth promoters at different temperatures are analyzed. It is shown that the parameters characterizing surface spikiness are able to quantify the effect of process temperature on the corrosion resistance of the coatings. It is suggested that these parameters can be used for predicting and characterizing the corrosion-resistant properties of magnetite coatings.

physics.chem-ph↗

arXiv2009

Anomalous diffusion in the dynamics of complex processes

Anomalous diffusion, process in which the mean-squared displacement of system states is a non-linear function of time, is usually identified in real stochastic processes by comparing experimental and theoretical displacements at relatively small time intervals. This paper proposes an interpolation expression for the identification of anomalous diffusion in complex signals for the cases when the dynamics of the system under study reaches a steady state (large time intervals). This interpolation expression uses the chaotic difference moment (transient structural function) of the second order as an average characteristic of displacements. A general procedure for identifying anomalous diffusion and calculating its parameters in real stochastic signals, which includes the removal of the regular (low-frequency) components from the source signal and the fitting of the chaotic part of the experimental difference moment of the second order to the interpolation expression, is presented. The procedure was applied to the analysis of the dynamics of magnetoencephalograms, blinking fluorescence of quantum dots, and X-ray emission from accreting objects. For all three applications, the interpolation was able to adequately describe the chaotic part of the experimental difference moment, which implies that anomalous diffusion manifests itself in these natural signals. The results of this study make it possible to broaden the range of complex natural processes in which anomalous diffusion can be identified. The relation between the interpolation expression and a diffusion model, which is derived in the paper, allows one to simulate the chaotic processes in the open complex systems with anomalous diffusion.

physics.data-an↗