arXiv subjects

Peilin Gao

Publications and source records attributed to Peilin Gao.

3 recordsLinked to original sources

arXiv2026

AEGIS: A Holistic Benchmark for Evaluating Forensic Analysis of AI-Generated Academic Images

We introduce AEGIS, A holistic benchmark for Evaluating forensic analysis of AI-Generated academic ImageS. Compared to existing benchmarks, AEGIS features three key advances: (1) Domain-Specific Complexity: covering seven academic categories with 39 fine-grained subtypes, exposing intrinsic forensic difficulty, where even GPT-5.1 reaches 48.80% overall performance and expert models achieve only limited localization accuracy (IoU 30.09%); (2) Diverse Forgery Simulations: modeling four prevalent academic forgery strategies across 25 generative models, with 11 yielding average forensic accuracy below 50%, showing that forensics lag behind generative advances; and (3) Multi-Dimensional Forensic Evaluation: jointly assessing detection, reasoning, and localization, revealing complementary strengths between model families, with multimodal large language models (MLLMs) at 84.74% accuracy in textual artifact recognition and expert detectors peaking at 79.54% accuracy in binary authenticity detection. By evaluating 25 leading MLLMs, nine expert models, and one unified multimodal understanding and generation model, AEGIS serves as a diagnostic testbed exposing fundamental limitations in academic image forensics.

cs.CV↗

arXiv2024

Film Thickness Gauge Based on Interferometric Principle of Y-shaped Optical Fiber

In this paper, a thin film thickness gauge based on the interferometric principle of Y-shaped optical fiber is proposed to achieve accurate measurement of film thickness. In this paper, the optical fiber, the interferometric principle and the film thickness calculation principle are introduced, and the interferometric thickness measurement system based on Y-shaped optical fiber is constructed. The system uses the special structure of Y-shaped optical fiber to transmit the optical signal generated by the light source to the surface of the thin film, and obtains coherent optical signals of different wavelengths through reflection and interference. The spectrometer is used to receive and interpret these interference signals, and the thickness of the film is calculated according to the wavelength difference of the peak positions of the adjacent stages, combined with the refractive index of the film. In the specific design, the paper elaborates on the design of each part of the instrument, including the selection and parameter setting of the light source, Y-fiber and spectrometer. Among them, the Y-shaped optical fiber, as the core component of the instrument, has the function of transmitting optical signals and detecting optical signals on the surface of thin films. At the same time, the paper also introduces the housing packaging and internal assembly process of the instrument to ensure the portability and stability of the instrument. The results show that the thickness gauge has high measurement accuracy and stability, which can meet the needs of practical applications.

physics.optics↗

arXiv2024

Multifunctional Portable Optical Measuring Instrument Based on Y-Fiber Optics

Based on grating diffraction principle, optical fiber transmission principle and optical interference principle, a multi-functional portable optical measuring instrument is constructed in this paper. The optical measurement visualization spectrometer based on CCD photoelectric image sensor is designed and assembled. The "Y" optical signal transmission fiber optical path suitable for multi-function measurement is improved and designed. The multi-function optical measurement system is built by combining with remote controlled multi-color LED lights. The spectral analysis, solution concentration monitoring and film thickness measurement are realized. The experimental results show that the observable wavelength range of the spectrometer is about 340-1050nm and the resolution is 1nm. The solution concentration can be obtained by measuring absorbance with optical fiber spectrometer. The film thickness measuring instrument can accurately measure the thickness of the micron film, and the measurement accuracy can reach 1.25 μm. It is proved that the instrument integrates multiple functions, has high measurement accuracy and wide range, and realizes non-contact measurement.

physics.optics↗