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Peter Tiemeijer

Publications and source records attributed to Peter Tiemeijer.

5 recordsLinked to original sources

Quantum tomography of inelastic electron scattering \emph{via} orbital angular momentum states

The physical properties of a quantum system, whether pure or mixed, are described fully by its density matrix. Recovery of the density matrix through projective measurements -- referred to as quantum state tomography -- is a cornerstone of quantum optics and metrology. The implementation of this approach in transmission electron microscopy, in particular for the characterisation of an electron beam after inelastic scattering, has remained a longstanding challenge as a result of the complexity of scanning high-dimensional phase spaces, with the number of required measurements growing quadratically with space dimensionality. Here, we introduce a simplified approach by restricting tomography to the electron orbital angular momentum (OAM) subspace. By using an electron optical device known as an OAM sorter, we discretise the phase space into a finite set of measurable states, thus significantly reducing the experimental and computational burden. The resulting measurements suffice to probe essential features of inelastic scattering. We demonstrate the technique by studying the inelastic scattering of a structured electron probe exciting volume plasmons in a carbon film. The combined use of a structured beams and OAM-resolved quantum tomography reveals symmetry-breaking effects and offers insight into the coherence and evolution of the scattered quantum states. Analysis of the diagonalised density matrices further reveals the nature of the induced state transitions, demonstrating the power of the approach for quantum tomography of electron scattering.

quant-ph

Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network

The key to optimizing spatial resolution in a state-of-the-art scanning transmission electron microscope is the ability to precisely measure and correct for electron optical aberrations of the probe-forming lenses. Several diagnostic methods for aberration measurement and correction with maximum precision and accuracy have been proposed, albeit often at the cost of relatively long acquisition times. Here, we illustrate how artificial intelligence can be used to provide near-real-time diagnosis of aberrations from individual Ronchigrams. The demonstrated speed of aberration measurement is important as microscope conditions can change rapidly, as well as for the operation of MEMS-based hardware correction elements that have less intrinsic stability than conventional electromagnetic lenses.

physics.ins-det

Experimental demonstration of an electrostatic orbital angular momentum sorter for electrons

We report the first experimental demonstration of an electrostatic electron orbital angular momentum (OAM) sorter, which can be used to analyze the OAM states of electrons in a transmission electron microscope. We verify the sorter functionality for several electron beams possessing different superpositions of OAM states, and use it to record the electron beams OAM spectra. Our current electrostatic OAM sorter has an OAM resolution of 2 in the units of h/bar - the reduced Planck constant. It is expected to increase the OAM resolution of the sorter to the optimal resolution of 1 in the future via fine control of the sorting phase elements.

physics.ins-det

Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy

Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning transmission electron microscope and demonstrate an improvement in spatial resolution. Such a holographic approach to spherical aberration correction is advantageous for its simplicity and cost-effectiveness.

physics.ins-det

Domain (Grain) Boundaries and Evidence of Twin Like Structures in CVD Grown Graphene

Understanding and engineering the domain boundaries in chemically vapor deposited (CVD) monolayer graphene will be critical for improving its properties. In this study, a combination of transmission electron microscopy (TEM) techniques including selected area electron diffraction (SAED), high resolution transmission electron microscopy (HRTEM), and dark field (DF) TEM was used to study the boundary orientation angle distribution and the nature of the carbon bonds at the domain boundaries. This report provides an important first step towards a fundamental understanding of these domain boundaries. The results show that, for the graphene grown in this study, the 46 measured misorientation angles are all between 11-30 degrees (with the exception of one at 7 degrees). HRTEM images show the presence of adsorbates in almost all of the boundary areas. When a boundary was imaged, defects were seen (dangling bonds) at the boundaries that likely contribute to adsorbates binding at these boundaries. DFTEM images also showed the presence of a 'twin like' boundary.

cond-mat.mtrl-sci