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Philip K. Cook

Publications and source records attributed to Philip K. Cook.

4 recordsLinked to original sources

X-ray induced grain boundary formation and grain rotation in Bi2Se3

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X- ray radiation can rapidly change size and texture of grains.

cond-mat.mtrl-sci

Universal mask for hard X rays

The penetrating power of X rays underpins important applications such as medical radiography. However, this same attribute makes it challenging to achieve flexible on-demand patterning of X-ray beams. One possible path to this goal is ``ghost projection'', a method which may be viewed as a reversed form of classical ghost imaging. This technique employs multiple exposures, of a single illuminated non-configurable mask that is transversely displaced to a number of specified positions, to create any desired pattern. An experimental proof-of-concept is given for this idea, using hard X rays. The written pattern is arbitrary, up to a tunable constant offset, and its spatial resolution is limited by both (i) the finest features present in the illuminated mask and (ii) inaccuracies in mask positioning and mask exposure time. In principle, the method could be used to make a universal lithographic mask in the hard-X-ray regime. Ghost projection might also be used as a dynamically-configurable beam-shaping element, namely the hard-X-ray equivalent of a spatial light modulator. The underpinning principle can be applied to gamma rays, neutrons, electrons, muons, and atomic beams. Our flexible approach to beam shaping gives a potentially useful means to manipulate such fields.

eess.IV

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

cond-mat.mtrl-sci

In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting

Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.

cond-mat.mtrl-sci