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Philip Shirvani

Publications and source records attributed to Philip Shirvani.

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The Anatomy of Silent Data Corruption: GPU Error Pattern Study and Modeling Guidance

Silent data corruption (SDC) threatens the reliability of large-scale GPU clusters used for training large language models, yet its rarity and lack of explicit error signals make accurate high-level modeling challenging. To address this gap, we conducted a large-scale gate-level stuck-at fault injection on a production-class data-center GPU, consuming over three million simulator hours across 63 CUDA micro-benchmarks. We extracted GPU SDC characteristics in terms of corruption types, bit-flip behavior, and warp-aligned spatial correlation. Our results show that NaN/+INF/-INF account for only 1.01% of SDC outcomes, that single-bit flips constitute less than 40% of bit-flip events, and that corruption addresses exhibit periodicity. These statistics motivate distribution-aware high-level fault modeling and realistic software-based fault injection for resilience evaluation of production-class GPU architectures.

cs.AR

LLM-PRISM: Characterizing Silent Data Corruption from Permanent GPU Faults in LLM Training

Large-scale LLM training is increasingly susceptible to hardware defects stemming from manufacturing escapes and silicon aging. These defects manifest as Silent Data Corruption (SDC) that perturb gradients and parameters throughout the training process. We present LLM-PRISM, a methodology to characterize LLM pre-training resilience to hardware faults. LLM-PRISM couples RTL-level GPU fault simulation with a stochastic injection engine embedded in Megatron-LM. Through 7,664 training runs across FP16, BF16, and FP8 regimes, we analyze how fault type, rate, and numeric format govern resilience. We find that while LLMs resist low-frequency faults, impact is highly non-uniform; critical datapaths and specific precision formats can induce catastrophic divergence even at moderate fault rates. This study provides the first hardware-grounded, pre-training characterization of SDC resilience.

cs.AR

Estimating Silent Data Corruption Rates Using a Two-Level Model

High-performance and safety-critical system architects must accurately evaluate the application-level silent data corruption (SDC) rates of processors to soft errors. Such an evaluation requires error propagation all the way from particle strikes on low-level state up to the program output. Existing approaches that rely on low-level simulations with fault injection cannot evaluate full applications because of their slow speeds, while application-level accelerated fault testing in accelerated particle beams is often impractical. We present a new two-level methodology for application resilience evaluation that overcomes these challenges. The proposed approach decomposes application failure rate estimation into (1) identifying how particle strikes in low-level unprotected state manifest at the architecture-level, and (2) measuring how such architecture-level manifestations propagate to the program output. We demonstrate the effectiveness of this approach on GPU architectures. We also show that using just one of the two steps can overestimate SDC rates and produce different trends---the composition of the two is needed for accurate reliability modeling.

cs.DC