Priyank Kalla | Searcharxiv

arXiv2026

Design Considerations for Phase Modulation in Testable Photonic Systems and Co-packaged Optics

As silicon photonic integrated circuits (PICs) scale in complexity, testing and calibration increasingly depend on effective phase modulation mechanisms. This work compares thermally induced phase modulation and carrier-based electrical modulation in Mach-Zehnder and microring modulators. The devices are designed and evaluated for extinction ratio, tuning efficiency, power consumption, and modulation bandwidth. The study identifies key trade-offs among modulation speed, energy consumption, and tuning controllability that directly influence the suitability of these methods for test signal generation and calibration tasks. The results highlight the relative advantages and limitations of thermal and electrical approaches across different operating regimes. These findings provide practical design guidance for selecting phase modulation strategies in scalable silicon photonic systems with integrated test and calibration requirements.

cs.ET↗

arXiv2026

Silicon Photonics Testing: Design for Testability, Fault Detection, and Manufacturing Variation Analysis in Photonic Integrated Circuits

This paper proposes a design-for-test (DFT) methodology and architecture for testing and validation of silicon photonic integrated circuits. We describe the design of silicon photonic circuits and components that comprise the proposed DFT architecture. The designs are extensively simulated and validated as test-access and fault-detection circuitry. We demonstrate how the DFT approach can be deployed on photonic integrated circuits and how they can be tested for correct operation, in terms of signal power and phase. The application is demonstrated on two distinct types of designs -- an optical neural network comprising optical devices in a feed-forward topology, and on an optical logic circuit with feedback loops.

cs.ET↗