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Qiwei Shi

Publications and source records attributed to Qiwei Shi.

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Experimentally-validated multi-slice simulation of electron diffraction patterns

High-Resolution Electron Backscatter Diffraction (HR-EBSD) has advanced rapidly in recent years, significantly improving elastic strain measurements and dislocation density evaluation with submicron spatial resolution. To achieve better accuracy in the measurements, high-quality dynamical simulation patterns are required to be matched with experimental ones. Currently, the most widely used pattern simulation method, the Bloch Wave method (BW), can accurately predict the positions and brightness of Kikuchi poles and bands, but is intrinsically limited to perfect crystal structures. Another simulation scheme, the multi-slice method (MS), follows the evolution of electron waves as they travel through the sample. MS is advantageous in simulating various defect structures with more diffraction details. Yet, it is mainly considered for theoretical developments and has not been compared to experimental data. This paper optimizes the MS method by abandoning the high-energy hypothesis and utilizing higher-order Taylor expansions to approach the forward-only Schrodinger equation. Experimental EBSD patterns of polycrystal Al-Mg alloys are used to challenge MS simulations as a reference for indexation. It is demonstrated that the 5th-order expansion of MS, referred to as MS5, achieves a good balance between computational cost and pattern precision. A tailored isotropic distortion correction model and standard stereographic triangle reconstruction enhance the precision of MS5 to be comparable with BW. To the best of our knowledge, this study provides the first comparison of MS EBSD simulations with experimental data. It opens new possibilities for EBSD characterization, such as reproducing diffraction patterns of crystals with various defects.

cond-mat.mtrl-sci

On stress-assisted boundary migration during recrystallization

This study investigates the boundary migration mechanisms near the sample surface of recrystallizing grains in high-purity Al subjected to cryogenic rolling. Local strain and stress tensors were characterized during \textit{in situ} annealing by combining high-resolution electron backscatter diffraction with microstructure-based digital image correlation strain analysis. The results reveal local residual strains on the order of $10^{-3}$ within the recrystallizing grain, with values several times higher in the adjacent deformed matrix. The residual stresses in recrystallizing grains are a passive response to those developed within the surrounding deformed grains; the latter being strongly influenced by the local geometry and characteristics of dislocation boundaries, as well as by constraints imposed by neighboring grains. No evidence of shear-coupled motion was observed during the recrystallization boundary migration, despite the presence of shear stress across the boundary. In contrast, detailed analysis of the principal strain components reveals a clear correlation between residual strain patterns and boundary migration directions. These findings indicate that recrystallization boundary migration is modulated by the anisotropy of the local internal stress state.

cond-mat.mtrl-sci