SearcharxivSearch

arXiv subjects

R. Ober

Publications and source records attributed to R. Ober.

3 recordsLinked to original sources

Correlation length of hydrophobic polyelectrolyte solutions

The combination of two techniques (Small Angle X-ray Scattering and Atomic Force Microscopy) has allowed us to measure in reciprocal and real space the correlation length $ξ$ of salt-free aqueous solutions of highly charged hydrophobic polyelectrolyte as a function of the polymer concentration $C_p$, charge fraction $f$ and chain length $N$. Contrary to the classical behaviour of hydrophilic polyelectrolytes in the strong coupling limit, $ξ$ is strongly dependent on $f$. In particular a continuous transition has been observed from $ξ\sim C_p^{-1/2}$ to $ξ\sim C_p^{-1/3}$ when $f$ decreased from 100% to 35%. We interpret this unusual behaviour as the consequence of the two features characterising the hydrophobic polyelectrolytes: the pearl necklace conformation of the chains and the anomalously strong reduction of the effective charge fraction.

cond-mat.soft

The effect of a nucleating agent on lamellar growth in melt-crystallizing polyethylene oxide

The effects of a (non co-crystallizing) nucleating agent on secondary nucleation rate and final lamellar thickness in isothermally melt-crystallizing polyethylene oxide are considered. SAXS reveals that lamellae formed in nucleated samples are thinner than in the pure samples crystallized at the same undercoolings. These results are in quantitative agreement with growth rate data obtained by calorimetry, and are interpreted as the effect of a local decrease of the basal surface tension, determined mainly by the nucleant molecules diffused out of the regions being about to crystallize. Quantitative agreement with a simple lattice model allows for some interpretation of the mechanism.

cond-mat.soft

Binary separation in very thin nematic films: thickness and phase coexistence

The behavior as a function of temperature of very thin films (10 to 200 nm) of pentylcyanobiphenyl (5CB) on silicon substrates is reported. In the vicinity of the nematic/isotropic transition we observe a coexistence of two regions of different thicknesses: thick regions are in the nematic state while thin ones are in the isotropic state. Moreover, the transition temperature is shifted downward following a 1/h^2 law (h is the film thickness). Microscope observations and small angle X-ray scattering allowed us to draw a phase diagram which is explained in terms of a binary first order phase transition where thickness plays the role of an order parameter.

cond-mat.soft