R. Proksch | Searcharxiv

arXiv2026

High Speed Contact-Resonance Tracking using Brownian motion

Contact-resonance atomic force microscopy (CR-AFM) provides nanoscale maps of contact stiffness, dissipation, and electromechanical response, but conventional piezoacoustic excitation can obscure the cantilever resonance with actuator and sample-holder modes. Pure Brownian excitation avoids this transfer-function background, yet its small amplitude generally requires averaging that is incompatible with routine imaging. We introduce interferometric dual-AC resonance tracking (iDART), which combines quadrature-phase differential interferometry with two-frequency resonance tracking. By positioning the interferometric spot near the displacement maximum of the first contact-resonance mode, the detector noise floor is reduced below the off-resonance thermal displacement of the cantilever. Brownian spectra identify the contact mode and define the tracking frequencies, while active electrical excitation provides the signal-to-noise ratio required for pixel-resolved imaging. Simultaneous low-frequency and resonant measurements show that both electrical and photothermal drive increases contrast in the amplitude and phase channels without appreciably shifting the contact resonance. These results establish a practical route to resonance-enhanced, drive free nanomechanical imaging at conventional AFM scan rates.

cond-mat.mes-hall↗

arXiv2025

iDART: Interferometric Dual-AC Resonance Tracking nano-electromechanical mapping

Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechanical functionalities. Quantitative imaging of nanoscale electromechanical phenomena requires high sensitivity while avoiding artifacts induced by large drive biases. Conventional PFM often relies on high voltages to overcome optical detection noise, leading to various non-ideal effects including electrostatic crosstalk, Joule heating, and tip-induced switching. To mitigate this situation, we introduce interferometrically detected, resonance-enhanced dual AC resonance tracking (iDART), which combines femtometer-scale displacement sensitivity of quadrature phase differential interferometry with contact resonance amplification. Through this combination, iDART achieves 10x or greater signal-to-noise improvement over current state of the art PFM approaches including both single frequency interferometric PFM or conventional, resonance enhanced PFM using optical beam detection. In this work, we demonstrate a >10x improvement of imaging sensitivity on PZT and Y-HfO. Switching spectroscopy shows similar improvements, where further demonstrates reliable hysteresis loops at small biases, mitigating nonlinearities and device failures that can occur at higher excitation amplitudes. These results position iDART as a powerful approach for probing conventional ferroelectrics with extremely high signal to noise down to weak piezoelectric systems, extending functional imaging capabilities to thin films, 2D ferroelectrics, beyond-CMOS technologies and bio-materials.

cond-mat.mes-hall↗