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Renée DePencier Piñero

Publications and source records attributed to Renée DePencier Piñero.

5 recordsLinked to original sources

Characterization and Comparison of Energy Relaxation in Fluxonium Qubits

Fluxonium superconducting qubits have demonstrated long coherence times and high single- and two-qubit gate fidelities, making them a favorable building block for superconducting quantum processors. We investigate the dominant limitations to fluxonium qubit energy relaxation time $T_1$ using a set of eight planar, aluminum-on-silicon qubits. We find that a circuit-based model for capacitive dielectric loss best captures the frequency dependence of $T_1$, which we analyze within both a two-level and a six-level energy relaxation model. We convert the measured $T_1$ into an effective capacitive quality factor $Q_\mathrm{C}^{\mathrm{eff}}$ to compare qubits on equal footing, accounting for independently estimated contributions from $1/f$ flux noise and radiative loss to the control and readout circuitry. We apply this methodology to compare qubits from two fabrication processes: a baseline process and one that applies a fluorine-based wet treatment prior to Josephson junction deposition. We resolve a small improvement of (13.8 $\pm$ 8.4$)\%$ in the process mean $Q_\mathrm{C}^{\mathrm{eff}}$, indicating that the fluorine treatment may have reduced loss from the metal-substrate interface, but did not address the primary source of loss in these fluxonium qubits.

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Hardware-efficient erasure-error detection with an integer fluxonium

Erasure-error detection can improve the efficiency of quantum error correction by revealing the times and locations of their error events. In this work, we demonstrate erasure conversions and mid-circuit erasure detections in a single integer fluxonium, in which the states $\mathrm{|g\rangle, |f\rangle}$ encode the logical states and $\mathrm{|e\rangle}$ encodes the erasure state. The integer fluxonium suppresses direct $|\mathrm{f} \rangle \rightarrow |\mathrm{g} \rangle$ transitions and allows the dominant $|\mathrm{f} \rangle \rightarrow |\mathrm{e}\rangle$ transitions to be converted into detectable erasures. Furthermore, we identified a design space that nullifies the resonant-frequency shift between the two logical states, enabling ancilla-free mid-circuit erasure checks using the same resonator employed for final readout. By discarding the detected erasure events, we achieved an 8.4-fold increase in the $|\mathrm{f}\rangle$ state lifetime, a 1.38-fold increase in the Hahn-echo time, and a reduction of single-qubit gate error from 0.061(2)% to 0.030(5)%. Our results establish integer fluxonium as a hardware-efficient platform for erasure-error detection and conversion, while identifying the improvements required to realize an effective erasure qubit with high erasure bias.

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Distinguishing types of correlated errors in superconducting qubits

Errors in superconducting qubits that are correlated in time and space can pose problems for quantum error correction codes. Radiation from cosmic and terrestrial sources can increase the quasiparticle (QP) density in a superconducting qubit device, resulting in an increased rate of QPs tunneling across proximal Josephson junctions (JJs) and causing correlated errors. Mechanical vibrations, such as those induced by the pulse tube (PT) in a dry dilution refrigerator, are also a known source of correlated errors. We measure two types of errors in the same device, linking the first to ionizing radiation and the second to PT operation. We present a method for distinguishing these two types of errors by their temporal, spatial, and frequency domain features, enabling physically motivated error-mitigation strategies. We also present accelerometer data to study the correlation between PT-induced vibrations and the errors. We measure arrays of transmon qubits where the difference in superconducting gap across the JJ is less than the qubit energy, as well as those where the gap is greater than the qubit energy, which has been shown to mitigate radiation-induced errors. The rate of both types of errors is reduced in these latter devices, suggesting that gap engineering is also protective against PT-induced errors.

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Characterization of Radiation-Induced Errors in Superconducting Qubits Protected with Various Gap-Engineering Strategies

Impacts from high-energy particles cause correlated errors in superconducting qubits by increasing the quasiparticle density in the vicinity of the Josephson junctions (JJs). Such errors are particularly harmful as they cannot be easily remedied via conventional error correcting codes. Recent experiments reduced correlated errors by making the difference in superconducting gap energy across the JJ larger than the qubit transition energy. In this work, we assess gap engineering near the JJ ($δΔ_{\mathrm{JJ}}$) and the capacitor/ground-plane ($δΔ_{\mathrm{M1}}$) by exposing arrays of transmon qubits to two sources of radiation. For $α$-particles from an $^{241}$Am source, we observe $T_1$ errors correlated in space and time, supporting a hypothesis that hadronic cosmic rays are a major contributor to the $10^{-10}$ error floor observed in Ref. 1. For electrons from a pulsed linear accelerator, we observe temporally correlated $T_1$ and $T_2$ errors, this measurement is insensitive to spatial correlations. We observe that the severity of correlated $T_1$ errors is reduced for qubit arrays with a greater degree of gap engineering at the JJ. For both $T_1$ and $T_2$ errors, the recovery time is hastened by an increased $δΔ_{\mathrm{M1}}$, which we attribute to the trapping of quasiparticles into the capacitor/ground-plane. We construct a model of quasiparticle dynamics that qualitatively agrees with our observations. This work reinforces the multifaceted influence of radiation on superconducting qubits and provides strategies for improving radiation resilience.

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Improving Transmon Qubit Performance with Fluorine-based Surface Treatments

Reducing materials and processing-induced decoherence is critical to the development of utility-scale quantum processors based on superconducting qubits. Here we report on the impact of two fluorine-based wet etches, which we use to treat the silicon surface underneath the Josephson junctions (JJs) of fixed-frequency transmon qubits made with aluminum base metallization. Using several materials analysis techniques, we demonstrate that these surface treatments can remove germanium residue introduced by our JJ fabrication with no other changes to the overall process flow. These surface treatments result in significantly improved energy relaxation times for the highest performing process, with median $T_1=334~μ$s, corresponding to quality factor $Q=6.6\times10^6$. This result suggests that the metal-substrate interface directly underneath the JJs was a major contributor to microwave loss in these transmon qubit circuits prior to integration of these surface treatments. Furthermore, this work illustrates how materials analysis can be used in conjunction with quantum device performance metrics to improve performance in superconducting qubits.

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