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Richard I. Todd

Publications and source records attributed to Richard I. Todd.

4 recordsLinked to original sources

Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation

Raman spectroscopy has been used to identify defective bonding in neon and silicon ion irradiated single crystals of 6H-SiC. Observable differences exist in the C-C bonding region corresponding to different defect structures for neon and silicon ion implantations. Raman spectra of ion irradiated SiC show less tensile strain than neutron irradiations, explained by a residual compressive stress caused by the swelling constrained by the undamaged substrate. Evidence of oxidation during high temperature ion implantation is observed as C-O and Si-O Raman signals. Annealing irradiated SiC while acquiring Raman spectra shows rapid recovery of Si-C bonding, but not a complete recovery of the unirradiated structure. Annealing irradiated SiC causes surface oxidation where unirradiated SiC does not oxidise. Comparisons are made to the apparent radiation resistance of diamond and silicon which have similar crystal structures, but are monatomic, leading to the suggestion that chemical defects are responsible for increased radiation damage in SiC.

cond-mat.mtrl-sci

Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties

Ion implantation is widely used as a surrogate for neutron irradiation in the investigation of radiation damage on the properties of materials. Due to the small depth of damage, micromechanical methods must be used to extract material properties. In this work, nanoindentation has been applied to ion irradiated silicon carbide to extract radiation-induced hardening. Residual stress is evaluated using HR-EBSD, AFM swelling measurements, and a novel microcantilever relaxation technique coupled with finite element modelling. Large compressive residual stresses of several GPa are found in the irradiated material, which contribute to the significant hardening observed in nanoindentation measurements. The origin of these residual stresses and the associated hardening is the unirradiated substrate which constrains radiation swelling. Comparisons with other materials susceptible to irradiation swelling show that this effect should not be neglected in studying the effects of ion irradiation damage on mechanical properties. This constraint may also be influencing fundamental radiation defects. This has significant implications for the suitability of ion implantation as a surrogate for neutron irradiations. These results demonstrate the significance of swelling-induced residual stresses in nuclear reactor components, and the impact on structural integrity of reactor components.

cond-mat.mtrl-sci

Warren-Averbach line broadening analysis from a time of flight neutron diffractometer

The well known Warren-Averbach theory of diffraction line profile broadening is shown to be applicable to time of flight data obtained from a neutron spallation source. Without modification, the method is applied to two very different examples; a cold worked ferritic steel and a thermally stressed alumina-30% SiC composite. Values of root mean square strains averaged over a range of lengths for the ferritic steel were used to estimate dislocation densities; values were found to be in good agreement with geometrically necessary dislocation densities independently measured from similarly orientated grains measured from electron backscatter diffraction analysis. An analytical model for the ceramic is described to validate the estimate of root mean square strain.

cond-mat.mtrl-sci

A Mathematical Model for Flash Sintering

A mathematical model is presented for the Joule heating that occurs in a ceramic powder compact during the process of flash sintering. The ceramic is assumed to have an electrical conductivity that increases with temperature, and this leads to the possibility of runaway heating that could facilitate and explain the rapid sintering seen in experiments. We consider reduced models that are sufficiently simple to enable concrete conclusions to be drawn about the mathematical nature of their solutions. In particular we discuss how different local and non-local reaction terms, which arise from specified experimental conditions of fixed voltage and current, lead to thermal runaway or to stable conditions. We identify incipient thermal runaway as a necessary condition for the flash event, and hence identify the conditions under which this is likely to occur.

math.AP