arXiv subjects

Richard Landers

Publications and source records attributed to Richard Landers.

3 recordsLinked to original sources

arXiv2026

Keeping an Eye on AI: A Framework for Effective Human Oversight of AI Systems

The use of Artificial Intelligence (AI) in high-risk, decision-making scenarios presents technical, safety, and normative challenges; problems that may only be ameliorated by human oversight. However, notions of human oversight lack a common foundational understanding: oversight architectures are not well defined, the roles involved remain unclear, and implementation steps are opaque. Hence, researchers and practitioners struggle to determine how to design, implement, and evaluate systems that enable effective human oversight. This paper advances a practical framework for effective human oversight of AI systems, based on a cross-disciplinary perspective that draws on insights from computer science, human-computer interaction, psychology, philosophy, and law. The core contributions are: (1) a foundational framework, with a working definition, architecture and processes for effective human oversight of AI systems; (2) an initial template for documenting oversight architectures and processes, applied to diverse domains; and (3) a synthesis of open research challenges that need to be considered in the emerging field of effective human oversight of AI systems.

cs.CY↗

arXiv2020

Selecting "Convenient Observers" to Probe the Atomic Structure of Epitaxial Graphene Grown on Ir(111) via Photoelectron Diffraction

Epitaxial graphene grown on metallic substrates presents, in several cases, a long-range periodic structure due to a lattice mismatch between the graphene and the substrate. For instance, graphene grown on Ir(111), displays a corrugated supercell with distinct adsorption sites due to a variation of its local electronic structure. This type of surface reconstruction represents a challenging problem for a detailed atomic surface structure determination for experimental and theoretical techniques. In this work, we revisited the surface structure determination of graphene on Ir(111) by using the unique advantage of surface and chemical selectivity of synchrotron-based photoelectron diffraction. We take advantage of the Ir 4f photoemission surface state and use its diffraction signal as a probe to investigate the atomic arrangement of the graphene topping layer. We determine the average height and the overall corrugation of the graphene layer, which are respectively equal to 3.40 $\pm 0.11 Å$ and 0.45 $\pm 0.03 Å$. Furthermore, we explore the graphene topography in the vicinity of its high-symmetry adsorption sites and show that the experimental data can be described by three reduced systems simplifying the Moiré supercell multiple scattering analysis.

cond-mat.mtrl-sci↗

arXiv2015

Surface Structure Determination of Black Phosphorus Using Photoelectron Diffraction

Atomic structure of single-crystalline black phosphorus was studied by high resolution synchrotron-based photoelectron diffraction (XPD). The results show that the topmost phosphorene layer in the black phosphorus is slightly displaced compared to the bulk structure and presents a small contraction in the direction perpendicular to the surface. Furthermore, the XPD results show the presence of a small buckling among the surface atoms, in agreement with previously reported scanning tunneling microscopy results. The contraction of the surface layer added to the presence of the buckling indicates an uniformity in the size of the sp3 bonds between P atoms at the surface.

cond-mat.mtrl-sci↗