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Rihao Li

Publications and source records attributed to Rihao Li.

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Feature Statistics with Uncertainty Help Adversarial Robustness

Despite the remarkable success of deep neural networks (DNNs), the security threat of adversarial attacks poses a significant challenge to the reliability of DNNs. In this paper, both theoretically and empirically, we discover a universal phenomenon that has been neglected in previous works, i.e., adversarial attacks tend to shift the distributions of feature statistics. Motivated by this finding, and by leveraging the advantages of uncertainty-aware stochastic methods in building robust models efficiently, we propose an uncertainty-driven feature statistics adjustment module for robustness enhancement, named Feature Statistics with Uncertainty (FSU). It randomly resamples channel-wise feature means and standard deviations of examples from multivariate Gaussian distributions, which helps to reconstruct the perturbed examples and calibrate the shifted distributions. The calibration recovers some domain characteristics of the data for classification, thereby mitigating the influence of perturbations and weakening the ability of attacks to deceive models. The proposed FSU module has universal applicability in training, attacking, predicting, and fine-tuning, demonstrating impressive robustness enhancement ability at a trivial additional time cost. For example, by fine-tuning the well-established models with FSU, the state-of-the-art methods achieve up to 17.13% and 34.82% robustness improvement against powerful AA and CW attacks on benchmark datasets.

cs.LG

An integral gated mode single photon detector at telecom wavelengths

We demonstrate an integral gated mode single photon detector at telecom wavelengths. The charge number of an avalanche pulse rather than the peak current is monitored for single-photon detection. The transient spikes in conventional gated mode operation are canceled completely by integrating, which enables one to improve the performance of single photon detector greatly with the same avalanche photodiode. This method has achieved a detection efficiency of 29.9% at the dark count probability per gate equal to 5.57E-6/gate (1.11E-6/ns) at 1550nm.

physics.optics