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Riko Kiessling

Publications and source records attributed to Riko Kiessling.

2 recordsLinked to original sources

Spectral narrowing of a phonon resonance in time-domain sum-frequency spectroscopy

Sum-frequency generation (SFG) spectroscopy provides a versatile method for the investigation of non-centrosymmetric media and interfaces. Here, using tunable picosecond infrared (IR) pulses from a free-electron laser, the nonlinear optical response of 4H-SiC, a common polytype of silicon carbide, has been probed in the frequency- and time-domain by infrared-visible vibrational SFG spectroscopy. In the SFG spectra we observe a sharp resonance near the longitudinal optical phonon frequency, arising from linear optical effects due the epsilon-near-zero regime of the IR permittivity. In the time domain, the build-up of the SFG intensity is linked to the free-induction decay of the induced coherent IR polarization. When approaching the frequency of the phonon resonance, a slower polarization dephasing is observed as compared to off-resonant IR excitation. Thus, by introducing a temporal delay between the IR and the visible up-conversion pulse we are able to demonstrate spectral narrowing of the phonon SFG resonance, as corroborated by model calculations.

cond-mat.mtrl-sci

Surface phonon polariton resonance imaging using long-wave infrared-visible sum-frequency generation microscopy

We experimentally demonstrate long-wave infrared-visible sum-frequency generation microscopy for imaging polaritonic resonances of infrared (IR) nanophotonic structures. This nonlinear-optical approach provides direct access to the resonant field enhancement of the polaritonic near fields, while the spatial resolution is limited by the wavelength of the visible sum-frequency signal. As a proof-of-concept, we here study periodic arrays of subdiffractional nanostructures made of 4H-silicon carbide supporting localized surface phonon polaritons. By spatially scanning tightly focused incident beams, we observe excellent sensitivity of the sum-frequency signal to the resonant polaritonic field enhancement, with a much improved spatial resolution determined by visible laser focal size. However, we report that the tight focusing can also induce sample damage, ultimately limiting the achievable resolution with the scanning probe method. As a perspective approach towards overcoming this limitation, we discuss the concept of using wide-field sum-frequency generation microscopy as a universal experimental tool that would offer long-wave IR super-resolution microscopy with spatial resolution far below the IR diffraction limit.

physics.optics