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Robert Jackson Spurling

Publications and source records attributed to Robert Jackson Spurling.

2 recordsLinked to original sources

Strain fluctuations unlock ferroelectricity in wurtzites

Ferroelectrics are of practical interest for non-volatile data storage due to their reorientable, crystallographically defined polarization. Yet efforts to integrate conventional ferroelectrics into ultrathin memories have been frustrated by film-thickness limitations, which impede polarization reversal under low applied voltage. Wurtzite materials, including magnesium-substituted zinc oxide (Zn,Mg)O, have been shown to exhibit scalable ferroelectricity as thin films. In this work, we explain the origins of ferroelectricity in (Zn,Mg)O, showing that large strain fluctuations emerge locally in (Zn,Mg)O and can reduce local barriers to ferroelectric switching by more than 40%. We provide concurrent experimental and computational evidence of these effects by demonstrating polarization switching in ZnO/(Zn,Mg)O/ZnO heterostructures featuring built-in interfacial strain gradients. These results open up an avenue to develop scalable ferroelectrics by controlling strain fluctuations atomistically.

cond-mat.mtrl-sci

Coexistence and interplay of two ferroelectric mechanisms in Zn1-xMgxO

Ferroelectric materials promise exceptional attributes including low power dissipation, fast operational speeds, enhanced endurance, and superior retention to revolutionize information technology. However, the practical application of ferroelectric-semiconductor memory devices has been significantly challenged by the incompatibility of traditional perovskite oxide ferroelectrics with metal-oxide-semiconductor technology. Recent discoveries of ferroelectricity in binary oxides such as Zn1-xMgxO and Hf1-xZrxO have been a focal point of research in ferroelectric information technology. This work investigates the ferroelectric properties of Zn1-xMgxO utilizing automated band excitation piezoresponse force microscopy. Our findings reveal the coexistence of two ferroelectric subsystems within Zn1-xMgxO. We propose a "fringing-ridge mechanism" of polarization switching that is characterized by initial lateral expansion of nucleation without significant propagation in depth, contradicting the conventional domain growth process observed in ferroelectrics. This unique polarization dynamics in Zn1-xMgxO suggests a new understanding of ferroelectric behavior, contributing to both the fundamental science of ferroelectrics and their application in information technology.

cond-mat.mtrl-sci