SearcharxivSearch

arXiv subjects

Rudolf Tromp

Publications and source records attributed to Rudolf Tromp.

2 recordsLinked to original sources

Super-resolution Optical Near-field EM for bio- and materials science

Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free imaging technique remains a central challenge in microscopy. Here, we introduce Optical Near-field Electron Microscopy (ONEM), a method that converts optical near-field intensity patterns into photoelectron emission, enabling nanometer-scale imaging using low-energy electron microscopy. ONEM achieves 31 nm spatial and sub-second temporal resolution without exposing the sample to electrons, preserving structural and functional integrity. We demonstrate ONEM across three distinct domains: imaging polarization-dependent plasmon modes in metal nanostructures; visualizing live Escherichia coli in liquid with orientation-resolved contrast in 3D; and capturing real-time electrodeposition of copper nanoclusters from solution. These results establish ONEM as a versatile platform for damage-free super-resolution imaging of interface dynamics in both vacuum and liquid, with broad implications for biology, electrochemistry, and nanophotonics.

physics.optics

Optical Near-Field Electron Microscopy

Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.

physics.app-ph