arXiv subjects

S. Bityukov

Publications and source records attributed to S. Bityukov.

5 recordsLinked to original sources

arXiv2013

The Transform between the space of observed values and the space of possible values of the parameter

In ref [math.ST/0411462] the notion of statistically dual distributions is introduced. The reconstruction of confidence density [AIP Conference Proceedings 803 (2005) 398] for the location parameter for several pairs of statistically dual distributions (Poisson and Gamma, normal and normal, Cauchy and Cauchy, Laplace and Laplace) in the case of single observation of the random variable is a unique. It allows to introduce the Transform between the space of observed values and the space of possible values of the parameter.

physics.data-an↗

arXiv2013

On the distinguishability of histograms

We consider an approach for testing the hypothesis that two realizations of the random variables in the form of histograms are taken from the same statistical population (i.e. two histograms are drawn from the same distribution). The approach is based on the notion "significance of deviation". This approach allows to estimate the statistical difference between two histograms using multi-dimensional test statistics. The distinguishability of histograms is estimated with the help of the construction a number of clones (rehistograms) of the observed histograms.

physics.data-an↗

arXiv2008

Collider aspects of flavour physics at high Q

This review presents flavour related issues in the production and decays of heavy states at LHC, both from the experimental side and from the theoretical side. We review top quark physics and discuss flavour aspects of several extensions of the Standard Model, such as supersymmetry, little Higgs model or models with extra dimensions. This includes discovery aspects as well as measurement of several properties of these heavy states. We also present public available computational tools related to this topic.

hep-ph↗

arXiv1998

Detector Construction Management and Quality Control: Establishing and Using a CRISTAL System

The CRISTAL (Cooperating Repositories and an Information System for Tracking Assembly Lifecycles) project is delivering a software system to facilitate the management of the engineering data collected at each stage of production of CMS. CRISTAL captures all the physical characteristics of CMS components as each sub-detector is tested and assembled. These data are retained for later use in areas such as detector slow control, calibration and maintenance. CRISTAL must, therefore, support different views onto its data dependent on the role of the user. These data viewpoints are investigated in this paper. In the recent past two CMS Notes have been written about CRISTAL. The first note, CMS 1996/003, detailed the requirements for CRISTAL, its relationship to other CMS software, its objectives and reviewed the technology on which it would be based. CMS 1997/104 explained some important design concepts on which CRISTAL is and showed how CRISTAL integrated the domains of product data man- agement and workflow management. This note explains, through the use of diagrams, how CRISTAL can be established for detector production and used as the information source for analyses, such as calibration and slow controls, carried out by physicists. The reader should consult the earlier CMS Notes and conference papers for technical detail on CRISTAL - this note concentrates on issues surrounding the practical use of the CRISTAL software.

physics.ins-det↗

arXiv1998

From Design to Production Control Through the Integration of Engineering Data Management and Workflow Management Systems

At a time when many companies are under pressure to reduce "times-to-market" the management of product information from the early stages of design through assembly to manufacture and production has become increasingly important. Similarly in the construction of high energy physics devices the collection of (often evolving) engineering data is central to the subsequent physics analysis. Traditionally in industry design engineers have employed Engineering Data Management Systems (also called Product Data Management Systems) to coordinate and control access to documented versions of product designs. However, these systems provide control only at the collaborative design level and are seldom used beyond design. Workflow management systems, on the other hand, are employed in industry to coordinate and support the more complex and repeatable work processes of the production environment. Commercial workflow products cannot support the highly dynamic activities found both in the design stages of product development and in rapidly evolving workflow definitions. The integration of Product Data Management with Workflow Management can provide support for product development from initial CAD/CAM collaborative design through to the support and optimisation of production workflow activities. This paper investigates this integration and proposes a philosophy for the support of product data throughout the full development and production lifecycle and demonstrates its usefulness in the construction of CMS detectors.

physics.ins-det↗