arXiv subjects

S. Hähnle

Publications and source records attributed to S. Hähnle.

4 recordsLinked to original sources

arXiv2026

DESHIMA 2.0: A 200-400 GHz Ultra-wideband Integrated Superconducting Spectrometer

DESHIMA (Deep Spectroscopic HIgh-redshift MApper) is a broadband integrated superconducting spectrometer (ISS) for millimeter (mm) / sub-millimeter (sub-mm) wave astronomy based on Kinetic Inductance Detectors (KIDs). This paper describes characterization of DESHIMA 2.0 in laboratory settings. The instrument features NbTiN superconducting microstrip (MS) filters with low-loss a-SiC:H dielectric and an ultra-wideband leaky-wave antenna. A laboratory setup was designed, incorporating the cryostat housing cryogenic optics and ISS chip comprising 339 KIDs connected to MS filters tuned for (sub-)mm wave frequencies. Room-temperature mirrors on a hexapod stage allowed precise positioning and alignment of optical elements. The sky-position chopper was positioned on a motor-controlled stage for fine-tuned control over its position and alignment. Thanks to the multiplexing capability of KIDs, we could simultaneously measure multiple performance metrics across the entire frequency range. We showed that DESHIMA 2.0 achieved significant improvements in performance compared to its predecessor (DESHIMA 1.0): measured instantaneous frequency coverage was 200$-$400 GHz with a mean filter $Q_{filter}$ of $340 \pm 50$; instrument efficiency reached $\sim8$ \%, indicating 4 times wider band coverage and 4 times higher sensitivity. The yield rate for MS filters exceeded 98 \%. The estimated aperture efficiency from measured beam patterns agreed well with the designed value of approximately 70 \%. The telescope far-field beam patterns calculated from measured beam patterns also exhibited good agreement with design specifications. We also demonstrated validity of a new method of absolute frequency calibration using the data from beam pattern measurement.

astro-ph.IM↗

arXiv2021

Hydrogenated Amorphous Silicon Carbide: A Low-loss Deposited Dielectric for Microwave to Submillimeter Wave Superconducting Circuits

Low-loss deposited dielectrics will benefit superconducting devices such as integrated superconducting spectrometers, superconducting qubits and kinetic inductance parametric amplifiers. Compared with planar structures, multi-layer structures such as microstrips are more compact and eliminate radiation loss at high frequencies. Multi-layer structures are most easily fabricated with deposited dielectrics, which typically exhibit higher dielectric loss than crystalline dielectrics. We measured the sub-kelvin and low-power microwave and mm-submm wave dielectric loss of hydrogenated amorphous silicon carbide (a-SiC:H), using a superconducting chip with NbTiN/a-SiC:H/NbTiN microstrip resonators. We deposited the a-SiC:H by plasma-enhanced chemical vapor deposition at a substrate temperature of 400°C. The a-SiC:H has a mm-submm loss tangent ranging from $0.80 \pm 0.01 \times 10^{-4}$ to $1.43 \pm 0.04 \times 10^{-4}$ in the range of 270 to 385 GHz. The microwave loss tangent is $3.2 \pm 0.2 \times 10^{-5}$. These are the lowest low-power sub-kelvin loss tangents that have been reported for microstrip resonators at mm-submm and microwave frequencies. We observe that the loss tangent increases with frequency. The a-SiC:H films are free of blisters and have low stress: $-$20 MPa compressive at 200 nm thickness to 60 MPa tensile at 1000 nm thickness.

cond-mat.mtrl-sci↗

arXiv2021

Superconducting Microstrip Losses at Microwave and Sub-millimeter wavelengths

We present a lab-on-chip experiment to accurately measure losses of superconducting microstrip lines at microwave and sub-mm wavelengths. The microstrips are fabricated from NbTiN, which is deposited using reactive magnetron sputtering, and amorphous silicon which is deposited using plasma-enhanced chemical vapor deposition (PECVD). Sub-mm wave losses are measured using on-chip Fabry-P{é}rot resonators (FPR) operating around $350\ $GHz. Microwave losses are measured using shunted half-wave resonators with an identical geometry and fabricated on the same chip. We measure a loss tangent of the amorphous silicon at single-photon energies of $\tanδ=3.7\pm0.5\times10^{-5}$ at $6\ $GHz and $\tanδ= 2.1\pm 0.1\times10^{-4}$ at $350\ $GHz. These results represent very low losses for deposited dielectrics, but the sub-mm wave losses are significantly higher than the microwave losses, which cannot be understood using the standard two-level system loss model.

physics.ins-det↗

arXiv2020

Suppression of radiation loss in high kinetic inductance superconducting co-planar waveguides

We present a novel lab-on-chip technique to measure the very low losses in superconducting transmission lines at (sub-) mm wavelengths. The chips consist of a 100 nm thick NbTiN Coplanar Waveguide (CPW) Fabry Perot (FP) resonator, coupled on one side to an antenna and on the other side to a Microwave Kinetic Inductance detector. Using a single frequency radiation source allows us to measure the frequency response of the FP around 350 GHz and deduce its losses. We show that the loss is dominated by radiation loss inside the CPW line that forms the FP and that it decreases with decreasing line width and increasing kinetic inductance as expected. The results can be quantitatively understood using SONNET simulations. The lowest loss is observed for a CPW with a total width of $6\ \mathrm{μm}$ and corresponds to a Q-factor of $\approx15,000$.

physics.ins-det↗