SearcharxivSearch

arXiv subjects

S. Plavully

Publications and source records attributed to S. Plavully.

2 recordsLinked to original sources

Electro- and photoproduction of muon pairs with $\mu$CLAS12: Double Deeply Virtual Compton Scattering, Timelike Compton Scattering, and $J/\psi$ production

The CEBAF Large Acceptance Spectrometer for operation at 12 GeV (CLAS12) at the Thomas Jefferson National Accelerator Facility has played a central role in advancing the understanding of nucleon and nuclear structure. As increasingly precise data become available, new physics opportunities emerge that extend beyond the current capabilities of CLAS12. In this article, a program to explore the quark and gluon structure of the nucleon through di-muon electro- and photoproduction is presented. Its primary focus is the measurement of beam-spin asymmetries in Double Deeply Virtual Compton Scattering, $ep \rightarrow e^\prime \mu^+ \mu^-p^\prime $. By independently varying the incoming and outgoing photon virtualities and momentum transfer, the DDVCS measurement provides access to the Generalized Parton Distributions over their full three-dimensional phase space, extending beyond the kinematic constraints of Deeply Virtual Compton Scattering and Timelike Compton Scattering. In addition, the large acceptance and high luminosity of the $\mu$CLAS12 experiment will enable precision measurements of near-threshold $J/\psi$ production and high-statistics studies of Timelike Compton Scattering.

hep-ex

Radiation tolerance tests on key components of the ePIC-dRICH readout card

The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5x5x12 cm^3 in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.

physics.ins-det