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S. Rottoo

Publications and source records attributed to S. Rottoo.

2 recordsLinked to original sources

Estimating cosmogenic backgrounds in nEXO at SNOLAB using Geant4 and FLUKA

The nEXO experiment was designed to search for neutrinoless double beta decay in the isotope $^{136}$Xe, using a five-tonne, isotopically-enriched liquid xenon time projection chamber (TPC). To meet nEXO's sensitivity goal, significant effort is placed on background mitigation strategies. Here, we evaluate the expected cosmogenic background rate for nEXO if placed at its preferred underground host site, SNOLAB. A comparison of results from Geant4 and FLUKA Monte Carlo simulations are presented. We perform detailed Monte Carlo simulations of muons reaching the underground SNOLAB environment using both Geant4 and FLUKA to study the production of radioactive isotopes from both direct spallation reactions or subsequent neutron-induced reactions. We find that, of the isotopes produced, the only one of concern for nEXO is $^{137}$Xe, produced by neutron capture on the xenon target. We develop a veto strategy that achieves an anticipated 92\% \xe{137} rejection efficiency while keeping dead time to less than 1 day over a 10 year exposure.

nucl-ex↗

Characterization of external cross-talk from silicon photomultipliers in a liquid xenon detector

The Light-only Liquid Xenon experiment (LoLX) employs a small-scale detector equipped with 96 Hamamatsu VUV4 silicon photomultipliers (SiPMs) submerged in 5 kg of liquid xenon (LXe) to perform characterization measurements of light production, transport and detection in xenon. In this work, we perform a novel measurement of the "external cross-talk" (ExCT) of SiPMs, where photons produced in the avalanche process escape the device and produce correlated signals on other SiPMs. SiPMs are the photodetector technology of choice for next generation rare-event search experiments; understanding the sources and effects of correlated noise in SiPMs is critical for producing accurate estimates of detector performance and sensitivity projections. We measure the probability to observe ExCT through timing correlation of detected photons in low-light conditions within LoLX. Measurements of SiPM ExCT are highly detector dependent; thus the ExCT process is simulated and modelled using the Geant4 framework. Using the simulation, we determine the average transport and detection efficiency for ExCT photons within LoLX, a necessary input to extract the expected ExCT probability from the data. For an applied overvoltage of 4 V and 5 V, we measure a mean number of photons emitted into the LXe per avalanche of $0.5^{+0.3}_{-0.2}$ and $0.6^{+0.3}_{-0.2}$, respectively. Using an optical model to describe photon transmission through the SiPM surface, this corresponds to an estimated photon yield inside the bulk silicon of $20^{+11}_{-9}$ and $25^{+12}_{-9}$ photons per avalanche. The relative increase in intensity of SiPM ExCT emission between 4 V and 5 V is consistent with expectation for the linear increase of gain with respect to overvoltage.

physics.ins-det↗