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Sabir Hussain

Publications and source records attributed to Sabir Hussain.

10 recordsLinked to original sources

Unveiling the delicate "hidden" interface conditions in WS2 flakes by advanced atomic force microscopy

The delicate interfacial conditions and behaviors play critical roles in determining the valuable physical properties of two-dimensional materials and their heterostructures on substrates. However, directly probing these complex interface conditions remains challenging. Here, we reveal the coupled in-plane strain and out-of-plane bonding conditions in strain-engineered WS2 flakes by combining dual-harmonic electrostatic force microscopy (DH-EFM) and scanning microwave impedance microscopy (sMIM). A striking contradiction is observed between the compressive-strain-induced larger bandgap (lower electrical conductivity) detected by DH-EFM, and the enhanced conductivity probed by sMIM. Comparative measurements under different sMIM modes demonstrate that this contradiction originates from a tip-loading-force-induced dynamic puckering effect, which is governed by the interfacial bonding strength. Furthermore, the progressive accumulation and subsequent release of conductivity during forward/backward sMIM-contact scans further confirms this dynamic puckering behavior, revealing pronounced differences in interface conditions between the open- and closed-ring regions of WS2. This work resolves the correlation between electrical properties and interface conditions, and provides fundamental insights for interface-engineered devices.

cond-mat.mtrl-sci

Toplayer-Dependent Crystallographic Orientation Imaging in the Bilayer Two-Dimensional Materials with Transverse Shear Microscopy

Nanocontact properties of two-dimensional (2D) materials are closely dependent on their unique nanomechanical systems, such as the number of atomic layers and the supporting substrate. Here, we report a direct observation of toplayer-dependent crystallographic orientation imaging of 2D materials with the transverse shear microscopy (TSM). Three typical nanomechanical systems, MoS2 on the amorphous SiO2/Si, graphene on the amorphous SiO2/Si, and MoS2 on the crystallized Al2O3, have been investigated in detail. This experimental observation reveals that puckering behaviour mainly occurs on the top layer of 2D materials, which is attributed to its direct contact adhesion with the AFM tip. Furthermore, the result of crystallographic orientation imaging of MoS2/SiO2/Si and MoS2/Al2O3 indicated that the underlying crystalline substrates almost do not contribute to the puckering effect of 2D materials. Our work directly revealed the top layer dependent puckering properties of 2D material, and demonstrate the general applications of TSM in the bilayer 2D systems.

cond-mat.mtrl-sci

Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy

The interlayer bonding in two dimensional materials is particularly important because it is not only related to their physical and chemical stability but also affects their mechanical, thermal, electronic, optical, and other properties. To address this issue, we report the direct characterization of the interlayer bonding in 2D SnSe using contact-resonance atomic force microscopy in this study. Site specific CR spectroscopy and CR force spectroscopy measurements are performed on both SnSe and its supporting SiO2 substrate comparatively. Based on the cantilever and contact mechanic models, the contact stiffness and vertical Young's modulus are evaluated in comparison with SiO2 as a reference material. The interlayer bonding of SnSe is further analyzed in combination with the semi-analytical model and density functional theory calculations. The direct characterization of interlayer interactions using this nondestructive methodology of CR AFM would facilitate a better understanding of the physical and chemical properties of 2D layered materials, specifically for interlayer intercalation and vertical heterostructures.

cond-mat.mtrl-sci

Properties of Soft Semi-open and Soft semi-closed Sets

Molodstov[10] introduced soft set theory as a new mathematical approach for solving problems having uncertainties. Many researchers worked on the findings of structures of soft set theory and applied to many problems having uncertainties. Recently, Bin Chen [3-4] introduced and explored the properties of soft semi-open sets and soft-semi-closed sets in soft topological spaces. In this paper we continue to investigate the properties of soft semi-open and soft semi-closed sets in soft topological spaces. We define soft semi-exterior, soft semi-boundary, soft semi-open neighbourhood and soft semi-open neighbourhood systems in soft topological spaces. Moreover we discuss the characterizations and properties of soft semi-interior, soft semi-exterior, soft semi-closure and soft semi-boundary. We also develop the relationship between soft semi-clopen sets and soft semi-boundary. The addition of this topic in literature will strengthen the theoretical base for further applications of soft topology in decision analysis and information systems.

math.GM

$γ^{*}$-semi-open Sets in Topological Spaces-II

In this paper, we continue studying the properties of $γ^{*}$-semi-open sets in topological spaces introduced by S. Hussain, B. Ahmad and T. Noiri[8]. We also introduce and discuss the $γ^{*}$-semi-continuous functions which generalize semi-continuous functions defined by N. Levine [10].

math.GN

On $γ$-Regular-Open Sets and $γ$-Closed Spaces

The purpose of this paper is to continue studying the properties of $γ$-regular open sets introduced and explored in [6]. The concept of $γ$-closed spaces have also been defined and discussed.

math.GN