arXiv subjects

Sean Breckling

Publications and source records attributed to Sean Breckling.

6 recordsLinked to original sources

arXiv2026

Cumulative X-ray Damage in Bismuth Selenide Examined by Simultaneous TXM and XRD

Bismuth selenide (Bi2Se3) is a topological insulator with potential applications in thermoelectrics, spintronics, and optoelectronics. However, its response to radiation remains poorly understood. We investigate cumulative X-ray damage in Bi2Se3 using simultane- ous transmission X-ray microscopy (TXM) and X-ray diffraction (XRD) at the Pohang Accelerator Laboratory X-Ray Free Electron Laser (PAL-XFEL) over 27,000 successive pulses. We observe distinct damage mechanisms: rapid hole formation via vaporization within 100 pulses, followed by slower grain refinement and material sputtering over thousands of thermal cycles. Williamson-Hall analysis reveals a progressive transformation from single-crystal to nanocrystalline structure, with grain sizes decreasing from mi- cron to nanometer scale. Finite-element modeling confirms that X-rays penetrate 13.47 {\mu}m, driving local temperatures above 1600 K with subsequent cooling between pulses. Scanning electron microscopy identifies three characteristic morphologies correspond- ing to different thermal histories: sputter streaks, prismatic crystals, and disordered microcrystals. Our results demonstrate that grain-boundary formation creates a feedback mechanism that accelerates damage in later pulses. This work establishes a method- ology for studying radiation damage across multiple length scales and provides insight into topological insulator stability under extreme conditions

cond-mat.mtrl-sci↗

arXiv2025

Single-View Tomographic Reconstruction Using Learned Primal Dual

The Learned Primal Dual (LPD) method has shown promising results in various tomographic reconstruction modalities, particularly under challenging acquisition restrictions such as limited viewing angles or a limited number of views. We investigate the performance of LPD in a more extreme case: single-view tomographic reconstructions of axially-symmetric targets. This study considers two modalities: the first assumes low-divergence or parallel X-rays. The second models a cone-beam X-ray imaging testbed. For both modalities, training data is generated using closed-form integral transforms, or physics-based ray-tracing software, then corrupted with blur and noise. Our results are then compared against common numerical inversion methodologies.

eess.IV↗

arXiv2023

Box-Constrained $L_1/L_2$ Minimization in Single-View Tomographic Reconstruction

We present a note on the implementation and efficacy of a box-constrained $L_1/L_2$ regularization in numerical optimization approaches to performing tomographic reconstruction from a single projection view. The constrained $L_1/L_2$ minimization problem is constructed and solved using the Alternating Direction Method of Multipliers (ADMM). We include brief discussions on parameter selection and numerical convergence, as well as detailed numerical demonstrations against relevant alternative methods. In particular, we benchmark against a box-constrained TVmin and an unconstrained Filtered Backprojection in both cone and parallel beam (Abel) forward models. We consider both a fully synthetic benchmark, and reconstructions from X-ray radiographic image data.

math.OC↗

arXiv2022

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

cond-mat.mtrl-sci↗

arXiv2022

An Online Dynamic Amplitude-Correcting Gradient Estimation Technique to Align X-ray Focusing Optics

High-brightness X-ray pulses, as generated at synchrotrons and X-ray free electron lasers (XFEL), are used in a variety of scientific experiments. Many experimental testbeds require optical equipment, e.g Compound Refractive Lenses (CRLs), to be precisely aligned and focused. The lateral alignment of CRLs to a beamline requires precise positioning along four axes: two translational, and the two rotational. At a synchrotron, alignment is often accomplished manually. However, XFEL beamlines present a beam brightness that fluctuates in time, making manual alignment a time-consuming endeavor. Automation using classic stochastic methods often fail, given the errant gradient estimates. We present an online correction based on the combination of a generalized finite difference stencil and a time-dependent sampling pattern. Error expectation is analyzed, and efficacy is demonstrated. We provide a proof of concept by laterally aligning optics on a simulated XFEL beamline.

physics.ins-det↗

arXiv2020

Methods to Quantify Dislocation Behavior with Dark-field X-ray Microscopy Timescans of Single-Crystal Aluminum

Crystal defects play a large role in how materials respond to their surroundings, yet there are many uncertainties in how extended defects form, move, and interact deep beneath a material's surface. A newly developed imaging diagnostic, dark-field X-ray microscopy (DFXM) can now visualize the behavior of line defects, known as dislocations, in materials under varying conditions. DFXM images visualize dislocations by imaging the very subtle long-range distortions in the material's crystal lattice, which produce a characteristic adjoined pair of bright and dark regions. Full analysis of how these dislocations evolve can be used to refine material models, however, it requires quantitative characterization of the statistics of their shape, position and motion. In this paper, we present a semi-automated approach to effectively isolate, track, and quantify the behavior of dislocations as composite objects. This analysis drives the statistical characterization of the defects, to include dislocation velocity and orientation in the crystal, for example, and is demonstrated on DFXM images measuring the evolution of defects at 98$\%$ of the melting temperature for single-crystal aluminum, collected at the European Synchrotron Radiation Facility.

physics.data-an↗