Selim Unal | Searcharxiv

arXiv2017

Fast and Highly Sensitive Ionic Polymer Gated WS$_2$-Graphene Photodetectors

The combination of graphene with semiconductor materials in heterostructure photodetectors, has enabled amplified detection of femtowatt light signals using micron-scale electronic devices. Presently, the speed of such detectors is limited by long-lived charge traps and impractical strategies, e.g. the use of large gate voltage pulses, have been employed to achieve bandwidths suitable for applications, such as video-frame-rate imaging. Here, we report atomically thin graphene-WS$_2$ heterostructure photodetectors encapsulated in an ionic polymer, which are uniquely able to operate at bandwidths up to 1.5 kHz, whilst maintaining internal gain as large as $10^6$. Highly mobile ions and a nanometre scale Debye length of the ionic polymer are used to screen charge traps and tune the Fermi level of graphene over an unprecedented range at the interface with WS$_2$. We observe a responsivity $R=10^6$ A W$^{-1}$ and detectivity $D^*=3.8\times10^{11}$ Jones, approaching that of single photon counters. The combination of both high responsivity and fast response times makes these photodetectors suitable for video-frame-rate imaging applications.

cond-mat.mes-hall↗

arXiv2016

Side-gate leakage and field emission in all-graphene field effect transistors on SiO2/Si substrate

We fabricate planar all-graphene field-effect transistors with self-aligned side-gates at 100 nm from the main graphene conductive channel, using a single lithographic step. We demonstrate side-gating below 1V with conductance modulation of 35% and transconductance up to 0.5 mS/mm at 10 mV drain bias. We measure the planar leakage along the SiO2/vacuum gate dielectric over a wide voltage range, reporting rapidly growing current above 15 V. We unveil the microscopic mechanisms driving the leakage, as Frenkel-Poole transport through SiO2 up to the activation of Fowler-Nordheim tunneling in vacuum, which becomes dominant at high voltages. We report a field-emission current density as high as 1uA/um between graphene flakes. These findings are essential for the miniaturization of atomically thin devices.

cond-mat.mes-hall↗