Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination
Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase retrieval to surpass the resolution limit imposed by the employed objective lens. In the FPM framework, the position of each sub-spectrum needs to be accurately known to ensure the success of the phase retrieval process. Different from the conventional methods with mechanical adjustment or data-driven optimization strategies, here we report a physics-based defocusing strategy for correcting large-scale positional deviation of the LED illumination in FPM. Based on a subpixel image registration process with a defocused object, we can directly infer the illumination parameters including the lateral offsets of the light source, the in-plane rotation angle of the LED array, and the distance between the sample and the LED board. The feasibility and effectiveness of our method are validated with both simulation study and experiments. We show that the reported strategy can obtain high-quality reconstruction of both the complex object and pupil even the LED array is randomly placed under the sample with both unknown lateral offsets and rotations. As such, it enables the development of robust FPM systems by reducing the requirement on fine mechanical adjustment and data-driven correction in the construction process.