arXiv subjects

Shengbo You

Publications and source records attributed to Shengbo You.

4 recordsLinked to original sources

arXiv2026

Transverse quantum-state characterization of programmable electron optics

Programmable electron optics -- electronically controlled phase plates -- underpin proposals from dose-efficient phase imaging to shaped-electron X-ray sources, nearly all assuming a pure, fully coherent delivered wave whose purity has never been measured. Here we reconstruct the transverse density matrix of a microelectromechanical electrostatic spiral phase plate by mixed-state ptychography, from one four-dimensional STEM scan per state and without added hardware. The delivered beam is substantially mixed: its purity falls from approximately 0.47 to approximately 0.24 as the applied bias grows, inconsistent with a fixed lateral source-blur model, while the real-space coherence width stays near 1 nm. The same scans calibrate the device in situ, allow virtual orbital-angular-momentum sorting and, through a partial-coherence-aware transfer theory, indicate that purifying the output could improve dose efficiency roughly threefold. One acquisition thus becomes a quantum-state acceptance test for programmable electron optics, supplying the purity and coherence that emerging phase-plate and diffractive-imaging schemes assume but leave unquantified.

physics.optics↗

arXiv2025

Gap-free Information Transfer in 4D-STEM via Fusion of Complementary Scattering Channels

Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these modalities, contrast transfer is often suppressed at low spatial frequencies, resulting in a characteristic contrast gap that limits quantitative imaging. Approaches that retain low-frequency phase contrast exist but typically require substantially increased experimental complexity, restricting routine use. Dark-field STEM imaging captures this missing low-frequency information through electrons scattered outside the bright-field disk, but discards a large fraction of the scattered signal and is therefore dose-inefficient. Fused Full-field STEM (FF-STEM) is introduced as a 4D-STEM imaging modality that overcomes this limitation by combining ptychographic phase reconstruction with tilt-corrected dark-field imaging within a single acquisition. Bright-field data are used to estimate probe aberrations and reconstruct a high-resolution phase image, while dark-field data provide complementary low-frequency contrast. The two channels are optimally fused in Fourier space using minimum-variance weighting based on the spectral signal-to-noise ratio, yielding transfer-gap-free images with high contrast and quantitative fidelity. FF-STEM preserves the upsampling and depth-sectioning capabilities of ptychography, adds robust low-frequency contrast characteristic of dark-field imaging, and enables dose-efficient, near-real-time reconstruction.

physics.optics↗

arXiv2025

Identification of Polytypism and Their Dislocations in Bilayer MoS2 Using Correlative Transmission Electron Microscopy and Raman Spectroscopy

Stacking orders and topological defects substantially influence the physical properties of 2D van der Waals (vdW) materials. However, the inherent features of 2D materials challenge the effectiveness of single characterization techniques in identifying stacking sequences, necessitating correlative approaches. Using bilayer MoS2 as a benchmark, we differentiate its polytypism and specific dislocations through transmission electron microscopy (TEM) and Raman spectroscopy. Perfect and partial dislocations were revealed in TEM, which are closely linked to the stacking sequences, thus indirectly indicating the 2H and 3R polytypes. 3D electron diffraction reconstruction on relrods and low-frequency Raman spectroscopy further validated these polytypes owing to their reliance on crystal symmetry. Surprisingly, we unexpectedly resolved both polytypes despite starting with 2H bulk crystal, pointing to a possible phase transition during mechanical exfoliation. The correlative TEM-Raman approach can be extended to other 2D materials, paving the way for property alteration via stacking and defect engineering.

cond-mat.mtrl-sci↗

arXiv2023

Magnetic Phase Imaging using Lorentz Near-field Electron Ptychography

Over the past few years, the combination of diffuser and near-field electron ptychography has drawn more attention by its ability to recover large field of view with few diffraction patterns. In this paper, we purpose a novel design and implementation of amplitude diffuser. The amplitude diffuser introduces structures to the illumination while reducing the inelastic scattering. And the amplitude diffuser is implemented at the condenser lens aperture, allowing us to vary the illumination size under the same microscope setup. We demonstrate the reconstruction results under both conventional Transmission Electron Microscopy (TEM) mode as well as Lorentz mode.

cond-mat.mtrl-sci↗