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Shifan Wang

Publications and source records attributed to Shifan Wang.

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Efficient and Robust p-type Transistor based on Ultra-wide-bandgap Semiconductor

The p-type transistor is an indispensable component of semiconductor technology, enabling complementary operation with n-channel transistors for computation, storage, and communication. Achieving both high robustness and high efficiency is highly desirable but challenging for p-type transistors due to limited semiconductors with reliable hole transport and their high activation energies. Here, we achieved a robust yet efficient p-type transistor by heterogeneously integrating an ultra-wide-bandgap semiconductor and a high-k dielectric layer through van der Waals integration. The p-type transistor employs a two-dimensional hole channel on hydrogenated diamond (bandgap 5.6 eV) combined with a high-k (30.5) SrTiO3 perovskite membrane. At room temperature, the transistor exhibits stable operation with a high on-current (~200 mA/mm), low subthreshold swing (70 mV/dec), high hole mobility (566 cm^2/Vs to 572 cm^2/Vs) and high on-off ratio (~10^9). Furthermore, tuning annealing temperature allows operation in either enhancement or depletion mode. The robust p-type transistor with high efficiency holds great potential for future power electronics, UV optoelectronics, and harsh-environment electronic applications.

cond-mat.mtrl-sci

High Pixel Resolution Visible to Extended Shortwave Infrared Single Pixel Imaging with a black Phosphorus-Molybdenum disulfide (bP-MoS2) photodiode

High-resolution infrared imagers are currently more expensive than CMOS and CCD cameras, due to costly sensor arrays. Van der Waals (vdWs) materials present an opportunity for low-cost, room temperature infrared photodetectors. Although photodetectors based on vdWs materials show promising performance, creating a megapixel array is yet to be achieved. Imaging with a single vdWs photodetector typically relies on time-consuming mechanical scanning and suffers from low resolution. Single pixel imaging (SPI) offers an affordable alternative to achieve high-resolution imaging, utilizing only one photodetector and a spatial light modulator. Progress in SPI using vdWs material photodetectors has been limited, with only one prior demonstration in the near infrared range (64$\times$64 pixels). In this work, we demonstrate a high-resolution SPI system (1023$\times$768 for visible light and 512$\times$512 for extended shortwave infrared) using a black phosphorus-molybdenum disulfide (bP-MoS$_2$) photodiode, surpassing earlier vdWs material SPI implementations by a factor of 64 in pixel count. We introduce an easy-to-implement edge detection method for rapid feature extraction. We employ compressed sampling and reduce imaging time by a factor of four. Our compressed sampling approach is based on a cyclic S-matrix, which is derived from a Hadamard-based sequence, where each row is a circular shift of the first row. This enables efficient imaging reconstruction via circular convolution and Fourier transforms, allowing fewer measurements while preserving the key image features. Our method for SPI using a vdWs material photodetector presents the opportunity for inexpensive shortwave infrared and midwave infrared cameras, and thus may enable advances in gas detection, biomedical imaging, autonomous driving, security, and surveillance.

eess.IV