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Shriya Sinha

Publications and source records attributed to Shriya Sinha.

2 recordsLinked to original sources

Probing Topological Surface States and Conduction via Extended Defects in (Bi$_{1-x}$Sb$_x$)$_2$Te$_3$ Films

(Bi$_{1-x}$Sb$_x$)$_2$Te$_3$ alloys are non-degenerate topological insulators (TIs) whose Dirac point (DP) can be tuned within the bulk bandgap by varying the composition, effectively reducing bulk conduction while allowing surface carrier conduction. Magnetotransport measurements of a series of (Bi$_{1-x}$Sb$_x$)$_2$Te$_3$ thin films indicate electron-dominated conduction, with weak anti-localization attributed to topological surface states (TSSs). Due to the similarity of phase coherence lengths and twin boundary spacings ($\sim$100 nm), we consider the role of twin boundaries as additional conducting paths. Density functional theory calculations reveal an enhanced density of states near the Fermi level at $60^\circ$ twin boundaries, with 2D carrier concentration in excess of $3 \times 10^{13}$ cm$^{-2}$. Furthermore, an analysis of the longitudinal magnetoconductivity yields an upper bound of $7.3 \times 10^{-4}$ S for twin boundary conductivity, resulting in a carrier mobility as high as $142$ cm$^2$/(V$\cdot$s). We discuss the role of twin boundaries in facilitating a transition from a massive Dirac cone dispersion to gapless, topologically protected surface states. Understanding the role of twin boundaries on carrier conduction in non-degenerate TIs is critical for the development of novel TI-based electronic devices.

cond-mat.mtrl-sci

Bulk transport paths through defects in floating zone and Al flux grown SmB$_6$

We investigate the roles of disorder on low-temperature transport in SmB$_6$ crystals grown by both the Al flux and floating zone methods. We used the inverted resistance method with Corbino geometry to investigate whether low-temperature variations in the standard resistance plateau arises from a surface or a bulk channel in floating zone samples. The results show significant sample-dependent residual bulk conduction, in contrast to smaller amounts of residual bulk conduction previously observed in Al flux grown samples with Sm vacancies. We consider hopping in an activated impurity band as a possible source for the observed bulk conduction, but it is unlikely that the large residual bulk conduction seen in floating zone samples is solely due to Sm vacancies. We therefore propose that one-dimensional defects, or dislocations, contribute as well. Using chemical etching, we find evidence for dislocations in both flux and floating zone samples, with higher dislocation density in floating zone samples than in Al flux grown samples. In addition to the possibility of transport through one-dimensional dislocations, we also discuss our results in the context of recent theoretical models of SmB$_6$.

cond-mat.str-el