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Siyu Guo

Publications and source records attributed to Siyu Guo.

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High-Dimensional Enhanced Sampling via Regularized Path-Dependent McKean--Vlasov Dynamics using Tensor Density Approximation

Sampling from high-dimensional Gibbs measures poses a challenge when the energy landscape consists of multiple metastable states. Enhanced-sampling methods mitigate this difficulty by introducing adaptive biasing potentials to facilitate the exploration along prescribed collective variables (CVs), but their scalability is often limited by the dimension of the CV space. Motivated by the Wasserstein-gradient-flow interpretation of adaptive biasing, we propose a regularized path-dependent McKean--Vlasov formulation for high-dimensional enhanced sampling. The formulation replaces the variational regularization of the Wasserstein functional by a direct regularization of the CV marginal density in the McKean--Vlasov drift, avoiding the outer convolution over the CV domain. Furthermore, it replaces the instantaneous law by a weighted path-history measure to improve statistical stability in the small-replica regime. We establish well-posedness of the resulting regularized and path-dependent stochastic dynamics under suitable assumptions. For numerical realization, the history-averaged CV marginal density is approximated using an optimization-free functional hierarchical tensor representation, leading to a scalable density-based adaptive biasing scheme. Numerical experiments on benchmark potentials and molecular systems demonstrate the effectiveness of the proposed method for sampling problems with CV dimensions up to 64.

math.NA

Detailed Performance Loss Analysis of Silicon Solar Cells using High-Throughput Metrology Methods

In this work, novel, high-throughput metrology methods are used to perform a detailed performance loss analysis of approximately 400 industrial crystalline silicon solar cells, all coming from the same production line. The characterization sequence includes a non-destructive transfer length method (TLM) measurement technique featuring circular TLM structures hidden within the busbar region of the cells. It also includes a very fast external quantum efficiency and reflectance measurement technique. More traditional measurements, like illuminated current-voltage, Suns-VOC, and photoluminescence imaging are also used to carry out the loss analysis. The variance of the individual loss parameters and their impact on cell performance are investigated and quantified for this large group of industrial solar cells. Some important correlations between the measured loss parameters are found. The nature of these distributions and correlations provide important insights about loss mechanisms in a cell and help prioritize efforts to optimize the performance of the production line.

physics.app-ph