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Sophie LaRochelle

Publications and source records attributed to Sophie LaRochelle.

2 recordsLinked to original sources

Machine Learning Models to Identify Promising Nested Antiresonance Nodeless Fiber Designs

Hollow-core fibers offer superior loss and latency characteristics compared to solid-core alternatives, yet the geometric complexity of nested antiresonance nodeless fibers (NANFs) makes traditional optimization computationally prohibitive. We propose a high-efficiency, two-stage machine learning framework designed to identify high-performance NANF designs using minimal training data. The model employs a neural network (NN) classifier to filter for single-mode designs (suppression ratio $\ge$ 50 dB), followed by a regressor that predicts confinement loss (CL). By training on the common logarithm of the loss, the regressor overcomes the challenges of high dynamic range. Using a sparse data set of only 1,819 designs, all with CL greater or equal to 1 dB/km, the model successfully identified optimized designs with a confirmed CL of 0.25 dB/km. {This demonstrates the NN has captured underlying physical behavior and is able to extrapolate to regions of lower CL. We show that small data sets are sufficient for stable, high-accuracy performance prediction, enabling the exploration of design spaces as large as $14e6$ cases at a negligible computational cost compared to finite element methods.

cs.LG↗

Fabry-Perot-Insensitive Edge Coupling for Robust PIC Characterization

In this work, we investigate the impact of Fabry-Perot (FP) cavities formed between a fiber array and a silicon chip during edge-coupled testing of photonic integrated circuits (PICs). Our results show that subwavelength variations in the distance between the fiber array and the device under test induce coupling efficiency modulations of several tenths of a decibel - challenging current alignment precision and undermining measurement repeatability in wafer-level probing. To address these FP-induced fluctuations, we introduce a complementary dual-measurement technique that shifts the chip-fiber separation by a quarter wavelength, thereby generating phase-opposite modulation artifacts that cancel upon averaging. This approach allows a higher tolerance in probe-to-PIC positioning by substantially eliminating the FP modulation. We also demonstrate how it can be leveraged to enhance repeatability and accurate positioning during alignment, reducing the insertion loss variability between multiple measurements from 0.34 to 0.04 dB. Such precision is essential for emerging applications like quantum photonics, silicon photonic sensors, and high-bandwidth optical interconnects where measurement accuracy directly impacts device performance characterization. Ultimately, our method offers a robust and accurate solution for high-throughput PIC characterization without requiring index-matching gel, which is impractical for wafer-level testing.

physics.optics↗