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Stacia Keller

Publications and source records attributed to Stacia Keller.

6 recordsLinked to original sources

High-Q, size-independent, and reconfigurable optical antennas via zero-index material dispersion engineering

Enhancing light-matter interactions at the nanoscale is foundational to nanophotonics, with epsilon near zero (ENZ) materials demonstrating significant potential.High-quality (Q) factor resonances maximizing these interactions are typically realized in photonic crystals requiring sub-50 nm precision nanofabrication over large areas, limiting scalability and increasing complexity. Mie resonances offer an alternative but are constrained by low Q factors due to the scarcity of high refractive index materials, necessitating large refractive index changes for effective resonance switching and limiting dynamic reconfigurability. We overcome these limitations by embedding Mie resonators within ENZ media, thereby enhancing Q- factors, mitigating geometric dispersion and fabrication challenges, and maximizing optical reconfigurability. We introduce three resonator-ENZ configurations - voids in AlN, Ge in $SiO_2$, and intrinsic InSb in doped InSb - spanning from low-loss phononic to lossy plasmonic ENZ modes.Using novel epitaxial regrowth techniques, we achieve significant Q-factor improvements over non-embedded resonators. Notably, an air-based Mie resonator embedded in AlN supports resonant Q-factors exceeding 100, with negligible geometric dispersion across sizes from 800 nm to 2,800 nm. Additionally, we demonstrate dynamic reconfigurability of intrinsic InSb resonators by thermally tuning the ENZ wavelength over a 2$μ$m range in the mid-infrared (11-16 $μ$m) wavelength regime. These results showcase the potential of Mie resonators embedded in ENZ media for high-fidelity sensors, thermal emitters, and reconfigurable metasurfaces, bridging theoretical predictions with practical applications, advancing the development of dynamic, high-Q optical devices.

physics.optics

Investigation of nitrogen polar p-type doped GaN/AlxGa(1-x)N superlattices for applications in wide-bandgap p-type field effect transistors

In this study the MOCVD growth and electrical properties of N-polar modulation doped p-AlGaN/GaN superlattices (SLs) were investigated. Hole sheet charge density and mobility were studied as a function of the concentration of the p-type dopant Mg in the SL and the number of SL periods. Room temperature Hall measurements were carried out to determine the hole mobility and the sheet charge density. While the hole density increased with increasing number of SL periods, the hole mobility was largely unaffected.Hole mobilities as high as 18cm2/Vs at a simultaneous high hole density of 6.5e13 cm-2 were observed for N-polar SLs with a Mg modulation doping of 7.5e18 cm-3. For comparable uniformly doped Ga-polar SL samples, a mobility of 11cm2/Vs was measured. Lowest sheet resistance in the GaN/AlGaN materials system of 5kOhm/sq is also reported. Test-structure transistors were also fabricated to investigate the applicability of these SL structures, with planar device resulting in a current of 5mA/mm, and a FinFET structure resulting in a current of over 100mA/mm.

physics.app-ph

AlGaN /GaN superlattice based p-channel field effect transistor (pFET) with TMAH treatment

To realize the full spectrum of advantages that the III-nitride materials system offers, the demonstration of p-channel III-nitride based devices is valuable. Authors report the first p-type field effect transistor (pFET) based on an AlGaN/GaN superlattice (SL), grown using MOCVD. Magnesium was used as the p-type dopant. A sheet resistance of 11.6 kΩ/sq, and a contact resistance of 14.9Ω.mm was determined using transmission line measurements (TLM) for a Mg doping of 1.5e19cm^-3 of Mg. Mobilities in the range of 7-10 cm\^2/Vs and a total sheet charge density in the range of 1e13-6e13 cm-2 were measured using room temperature Hall effect measurements. Without Tetramethylammonium hydroxide (TMAH) treatment, the fabricated pFETs had a maximum drain-source current (IDS) of 3mA/mm and an On-Resistance (RON) of 3.48 kΩ.mm, and did not turn-off completely. With TMAH treatment during fabrication, a maximum IDS of 4.5mA/mm, RON of 2.2kΩ.mm, and five orders of current modulation was demonstrated, which is the highest achieved for a p-type transistor based on (Al,Ga)N.

physics.app-ph

Lateral Confinement of Electrons in Vicinal N-polar AlGaN/GaN Heterostructure

We studied orientation dependent transport in vicinal N-polar AlGaN/GaN heterostructures. We observed significant anisotropy in the current carrying charge parallel and perpendicular to the miscut direction. A quantitative estimate of the charge anisotropy was made based on gated TLM and Hall measurements. The formation of electro-statically confined one-dimensional channels is hypothesized to explain charge anisotropy. A mathematical model was used to verify that polarization charges distributed on miscut structure can create lateral one-dimensional confinement in vicinal substrates. This polarization-engineered electrostatic confinement observed is promising for new research on low-dimensional physics and devices besides providing a template for manufacturable one-dimensional devices.

cond-mat.mtrl-sci

Stimulated emission and ultrafast carrier relaxation in InGaN multiple quantum wells

Stimulated emission (SE) was measured from two InGaN multiple quantum well (MQW) laser structures with different In compositions. SE threshold power densities (I_th) increased with increasing QW depth (x). Time-resolved differential transmission measurements mapped the carrier relaxation mechanisms and explained the dependence of I_th on x. Carriers are captured from the barriers to the QWs in < 1 ps, while carrier recombination rates increased with increasing x. For excitation above I_th an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing I_th.

cond-mat.mes-hall

Realization of wide electron slabs by polarization bulk doping in graded III-V nitride semiconductor alloys

We present the concept and experimental realization of polarization-induced bulk electron doping in III-V nitride semiconductors. By exploiting the large polarization charges in the III-V nitrides, we are able to create wide slabs of high density mobile electrons without introducing shallow donors. Transport measurements reveal the superior properties of the polarization doped electron distributions than comparable shallow donor doped structures. The technique is readily employed for creating highly conductive layers in many device structures.

cond-mat