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Steffen Staeck

Publications and source records attributed to Steffen Staeck.

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Diamond compound refractive lenses for high energy Dark Field X-ray Microscopy

Compound-refractive lenses (CRL) are a type of x-ray optics that find widespread applications as focusing and imaging lenses. The choice of material is one of the most defining properties of these lenses. In this work, we present a CRL made out of diamond. It provides an advantageous balance between refractivity and absorption, along with good manufacturability. Compared to Be CRLs, it features a higher optical density and thus enables application at higher photon energies without relying on large lens stacks or very small radii of curvature, which are challenging to manufacture. A diamond CRL is characterized for use as an objective for Dark-field X-ray Microscopy (DFXM) at the ID03 beamline of the European Synchrotron Radiation Facility (ESRF) and compared to Al and Be CRLs at 17 keV, 33 keV and 37 keV. Increasing the photon energy in DFXM from 17 keV to 37 keV opens up the possibility to investigate new sample systems, that were previously opaque to low energy x-ray radiation. The capability of the diamond CRL at 33 keV is illustrated through DFXM measurements on two 0.5 mm-thick iron-based samples, which cannot be probed at 17 keV.

cond-mat.mtrl-sci

Multilayer Laue Lenses for Enhanced Spatial Resolution in Dark-Field X-ray Microscopy

We introduce the use of a crossed pair of Multilayer Laue Lenses (MLLs) as an objective in Dark-Field X-ray Microscopy (DFXM). In a demonstration experiment at the ID03 beamline at ESRF, two flat Mo-Si MLLs were used, with a physical aperture of 50 x 50 $\mathrm{\mu m^2}$ and a focal length of 14.25 mm at 19 keV. Applying a 10 % criterion to the Modulation Transfer Functions (MTFs) acquired, a spatial resolution of 56 nm is obtained in bright-field mode -- more than three times better than with a compound refractive lens (CRL) objective. The dark-field resolution is similar. With an efficiency of 26.7 % the MLL objective expands the science domain of DFXM significantly, both for bulk and near-surface studies. Similar to the CRL case, the reciprocal space resolution is dominated by the numerical aperture (NA) of the objective, with the NA being three times larger in the MLL case. This enables faster orientation mapping and implies improved options for the use of tomographic reconstruction algorithms. Although the MLL objective pupil varies with energy and position, secondary peaks are suppressed, simplifying both interpretation and forward simulations. We present an example DFXM application using the MLL as an objective, imaging a through-silicon via Kelvin device.

cond-mat.mtrl-sci

Quantifying Resolution in Pink Beam Dark Field X-ray Microscopy: Experiments and Simulations

Pink-beam Dark-Field X-ray Microscopy (pDFXM) is a powerful emerging technique for time-resolved studies of microstructure and strain evolution in bulk crystalline materials. In this work, we systematically assess the performance of pDFXM relative to monochromatic DFXM when using a compound refractive lens (CRL) as the objective. Analytical expressions for the spatial and angular resolution are derived and compared with numerical simulations based on geometrical optics and experimental data. The pink-beam configuration provides an increased diffraction intensity depending on the deformation state of the sample, accompanied by a general tenfold degradation in angular resolution along the rocking and longitudinal directions. This trade-off is disadvantageous for axial strain mapping, but can be advantageous in cases where integrated intensities are needed. For a perfect crystal under parallel illumination with a pink beam, our results show that chromatic aberration is absent, whereas under condensed illumination it becomes significant. The aberration is shown to depend strongly on the local distortion of the crystal. Weak-beam imaging conditions, such as those required for resolving dislocations, are shown to remain feasible under pink-beam operation and may even provide an improved signal-to-noise ratio. The higher incident flux, enhanced by nearly two orders of magnitude, is quantified in terms of beam heating effects, and implications for optimized scanning protocols are discussed.

physics.optics