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Steven W. Allen

Publications and source records attributed to Steven W. Allen.

At least 37 records · Page 2Linked to original sources

Development and testing of integrated readout electronics for next generation SiSeRO (Single electron Sensitive Read Out) devices

The first generation of Single electron Sensitive Read Out (SiSeRO) amplifiers, employed as on-chip charge detectors for charge-coupled devices (CCDs) have demonstrated excellent noise and spectral performance: a responsivity of around 800 pA per electron, an equivalent noise charge (ENC) of 3.2 electrons root mean square (RMS), and a full width half maximum (FWHM) energy resolution of 130 eV at 5.9 keV for a readout speed of 625 Kpixel/s. Repetitive Non Destructive Readout (RNDR) has also been demonstrated with these devices, achieving an improved ENC performance of 0.36 electrons RMS after 200 RNDR cycles. In order to mature this technology further, Stanford University, in collaboration with MIT Kavli Institute and MIT Lincoln Laboratory, are developing new SiSeRO detectors with improved geometries that should enable greater responsivity and improved noise performance. These include CCD devices employing arrays of SiSeRO amplifiers to optimize high speed, low noise RNDR readout and a proof-of-concept SiSeRO active pixel sensor (APS). To read out these devices, our team has developed a compact, 8-channel, fast, low noise, low power application specific integrated circuit (ASIC) denoted the Multi-Channel Readout Chip (MCRC) that includes an experimental drain current readout mode intended for SiSeRO devices. In this paper, we present results from the first tests of SiSeRO CCD devices operating with MCRC readout, and our designs for next generation SiSeRO devices.

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Fast, low noise CCD systems for future strategic x-ray missions

Future strategic X-ray missions, such as the Advanced X-ray Imaging Satellite (AXIS) and those targeted by the Great Observatories Maturation Program (GOMaP), require fast, low-noise X-ray imaging spectrometers. To achieve the speed and noise capabilities required by such programs, the X-ray Astronomy and Observational Cosmology (XOC) Group at Stanford, in collaboration with the MIT Kavli Institute (MKI) and MIT Lincoln Laboratory (MIT-LL), is developing readout systems that leverage the high speed, low noise, and low power consumption of application-specific integrated circuit (ASIC) devices. Here, we report the energy resolution and noise performance achieved using MIT-LL AXIS prototype charge-coupled device (CCD) detectors in conjunction with Stanford-developed Multi-Channel Readout Chip (MCRC) ASICs. Additionally, we present a new sampling method for simultaneous optimization of the output gate (OG), reset gate (RG), and reset drain (RD) biases which, in combination with new integrated fast summing well (SW) and RG clock operation modes, enables the data rates required of future X-ray telescopes.

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Ground calibration plans for the AXIS high speed camera

The Advanced X-ray Imaging Satellite (AXIS), an astrophysics NASA probe mission currently in phase A, will provide high-throughput, high-spatial resolution X-ray imaging in the 0.3 to 10 keV band. We report on the notional ground calibration plan for the High Speed Camera on AXIS, which is being developed at the MIT Kavli Institute for Astrophysics and Space Research using state-of-the-art CCDs provided by MIT Lincoln Laboratory in combination with an integrated, high-speed ASIC readout chip from Stanford University. AXIS camera ground calibration draws on previous experience with X-ray CCD focal plans, in particular Chandra/ACIS and Suzaku/XIS, utilizing mono-energetic X-ray line sources to measure spectral resolution and quantum efficiency. Relative quantum efficiency of the CCDs will be measured against an sCMOS device, with known absolute calibration from synchrotron measurements. We walk through the envisioned CCD calibration pipeline and we discuss the observatory-level science and calibration requirements and how they inform the camera calibration.

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Design, development, and commissioning of a flexible test setup for the AXIS prototype detector

The Advanced X-ray Imaging Satellite (AXIS) is one of two candidate mission concepts selected for Phase-A study for the new NASA Astrophysics Probe Explorer (APEX) mission class, with a planned launch in 2032. The X-ray camera for AXIS is under joint development by the X-ray Astronomy and Observational Cosmology (XOC) Group at Stanford, the MIT Kavli Institute (MKI), and MIT Lincoln Laboratory (MIT-LL). To accelerate development efforts and meet the AXIS mission requirements, XOC has developed a twin beamline testing system, capable of providing the necessary performance, flexibility, and robustness. We present design details, simulations, and performance results for the newer of the two beamlines, constructed and optimized to test and characterize the first full-size MIT-LL AXIS prototype detectors, operating with the Stanford-developed Multi-Channel Readout Chip (MCRC) integrated readout electronics system. The XOC X-ray beamline design is forward-looking and flexible, with a modular structure adaptable to a wide range of detector technologies identified by the Great Observatories Maturation Program (GOMAP) that span the X-ray to near-infrared wavelengths.

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Variable X-ray reverberation in the rapidly accreting AGN Ark 564: the response of the soft excess to the changing geometry of the inner accretion flow

X-ray reverberation, which exploits the time delays between variability in different energy bands as a function of Fourier frequency, probes the structure of the inner accretion disks and X-ray coronae of active galactic nuclei. We present a systematic X-ray spectroscopic and reverberation study of the high-Eddington-ratio narrow-line Seyfert 1 galaxy Ark 564, using over 900 ks of \textit{XMM-Newton} and \textit{NuSTAR} observations spanning 13 years. The time-averaged spectra can be well described by the a model consisting of a coronal continuum, relativistic disk reflection, warm Comptonization, and three warm absorbers. Leveraging the high X-ray brightness of Ark 564, we are able to resolve the time evolution of the spectra and contemporaneous reverberation lags. The soft-band lag relative to the continuum increases with the X-ray flux, while Fe K$α$ lags are detected in only a subset of epochs and do not correlate with soft lags. Models based on a lamppost corona and reflection from a standard thin disk can broadly reproduce the observed lag-energy spectra of low-flux epochs; however, additional reverberation from the warm Comptonized atmosphere is required to explain the soft lags observed in high-flux epochs. A vertically puffed-up inner disk and a variable, vertically extended corona can better explain the observed evolution of the lags and covariance spectra. Our study underscores the importance of multi-epoch, multi-band analyses for a comprehensive understanding the inner accretion disk and corona.

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Continued developments in X-ray speed reading: fast, low noise readout for next-generation wide-field imagers

Future strategic X-ray astronomy missions will require unprecedentedly sensitive wide-field imagers providing high frame rates, low readout noise and excellent soft energy response. To meet these needs, our team is employing a multi-pronged approach to advance several key areas of technology. Our first focus is on advanced readout electronics, specifically integrated electronics, where we are collaborating on the VERITAS readout chip for the Athena Wide Field Imager, and have developed the Multi-Channel Readout Chip (MCRC), which enables fast readout and high frame rates for MIT-LL JFET (junction field effect transistor) CCDs. Second, we are contributing to novel detector development, specifically the SiSeRO (Single electron Sensitive Read Out) devices fabricated at MIT Lincoln Laboratory, and their advanced readout, to achieve sub-electron noise performance. Hardware components set the stage for performance, but their efficient utilization relies on software and algorithms for signal and event processing. Our group is developing digital waveform filtering and AI methods to augment detector performance, including enhanced particle background screening and improved event characterization. All of these efforts make use of an efficient, new X-ray beamline facility at Stanford, where components and concepts can be tested and characterized.

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Demonstrating sub-electron noise performance in Single electron Sensitive Readout (SiSeRO) devices

Single electron Sensitive Read Out (SiSeRO) is a novel on-chip charge detection technology that can, in principle, provide significantly greater responsivity and improved noise performance than traditional charge coupled device (CCD) readout circuitry. The SiSeRO, developed by MIT Lincoln Laboratory, uses a p-MOSFET transistor with a depleted back-gate region under the transistor channel; as charge is transferred into the back gate region, the transistor current is modulated. With our first generation SiSeRO devices, we previously achieved a responsivity of around 800 pA per electron, an equivalent noise charge (ENC) of 4.5 electrons root mean square (RMS), and a full width at half maximum (FWHM) spectral resolution of 130 eV at 5.9 keV, at a readout speed of 625 Kpixel/s and for a detector temperature of 250 K. Importantly, since the charge signal remains unaffected by the SiSeRO readout process, we have also been able to implement Repetitive Non-Destructive Readout (RNDR), achieving an improved ENC performance. In this paper, we demonstrate sub-electron noise sensitivity with these devices, utilizing an enhanced test setup optimized for RNDR measurements, with excellent temperature control, improved readout circuitry, and advanced digital filtering techniques. We are currently fabricating new SiSeRO detectors with more sensitive and RNDR-optimized amplifier designs, which will help mature the SiSeRO technology in the future and eventually lead to the pathway to develop active pixel sensor (APS) arrays using sensitive SiSeRO amplifiers on each pixel. Active pixel devices with sub-electron sensitivity and fast readout present an exciting option for next generation, large area astronomical X-ray telescopes requiring fast, low-noise megapixel imagers.

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The XOC X-ray Beamline: Probing Colder, Quieter, and Softer

Future strategic X-ray satellite telescopes, such as the probe-class Advanced X-ray Imaging Satellite (AXIS), will require excellent soft energy response in their imaging detectors to enable maximum discovery potential. In order to characterize Charge-Coupled Device (CCD) and Single Electron Sensitive Read Output (SiSeRO) detectors in the soft X-ray region, the X-ray Astronomy and Observational Cosmology (XOC) group at Stanford has developed, assembled, and commissioned a 2.5-meter-long X-ray beamline test system. The beamline is designed to efficiently produce monoenergetic X-ray fluorescence lines in the 0.3-10 keV energy range and achieve detector temperatures as low as 173 K. We present design and simulation details of the beamline, and discuss the vacuum, cooling, and X-ray fluorescence performance achieved. As a workhorse for future detector characterization at Stanford, the XOC beamline will support detector development for a broad range of X-ray astronomy instruments.

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X-ray speed reading with the MCRC: prototype success and next generation upgrades

The Advanced X-ray Imaging Satellite (AXIS) is a NASA probe class mission concept designed to deliver arcsecond resolution with an effective area ten times that of Chandra (at launch). The AXIS focal plane features an MIT Lincoln Laboratory (MIT-LL) X-ray charge-coupled device (CCD) detector working in conjunction with an application specific integrated circuit (ASIC), denoted the Multi-Channel Readout Chip (MCRC). While this readout ASIC targets the AXIS mission, it is applicable to a range of potential X-ray missions with comparable readout requirements. Designed by the X-ray astronomy and Observational Cosmology (XOC) group at Stanford University, the MCRC ASIC prototype (MCRC-V1.0) uses a 350 nm technology node and provides 8 channels of high speed, low noise, low power consumption readout electronics. Each channel implements a current source to bias the detector output driver, a preamplifier to provide gain, and an output buffer to interface directly to an analog-to-digital (ADC) converter. The MCRC-V1 ASIC exhibits comparable performance to our best discrete electronics implementations, but with ten times less power consumption and a fraction of the footprint area. In a total ionizing dose (TID) test, the chip demonstrated a radiation hardness equal or greater to 25 krad, confirming the suitability of the process technology and layout techniques used in its design. The next iteration of the ASIC (MCRC-V2) will expand the channel count and extend the interfaces to external circuits, advancing its readiness as a readout-on-a-chip solution for next generation X-ray CCD-like detectors. This paper summarizes our most recent characterization efforts, including the TID radiation campaign and results from the first operation of the MCRC ASIC in combination with a representative MIT-LL CCD.

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Towards efficient machine-learning-based reduction of the cosmic-ray induced background in X-ray imaging detectors: increasing context awareness

Traditional cosmic ray filtering algorithms used in X-ray imaging detectors aboard space telescopes perform event reconstruction based on the properties of activated pixels above a certain energy threshold, within 3x3 or 5x5 pixel sliding windows. This approach can reject up to 98% of the cosmic ray background. However, the remaining unrejected background constitutes a significant impediment to studies of low surface brightness objects, which are especially prevalent in the high-redshift universe. The main limitation of the traditional filtering algorithms is their ignorance of the long-range contextual information present in image frames. This becomes particularly problematic when analyzing signals created by secondary particles produced during interactions of cosmic rays with body of the detector. Such signals may look identical to the energy deposition left by X-ray photons, when one considers only the properties within the small sliding window. Additional information is present, however, in the spatial and energy correlations between signals in different parts of the frame, which can be accessed by modern machine learning (ML) techniques. In this work, we continue the development of an ML-based pipeline for cosmic ray background mitigation. Our latest method consist of two stages: first, a frame classification neural network is used to create class activation maps (CAM), localizing all events within the frame; second, after event reconstruction, a random forest classifier, using features obtained from CAMs, is used to separate X-ray and cosmic ray features. The method delivers >40% relative improvement over traditional filtering in background rejection in standard 0.3-10keV energy range, at the expense of only a small (<2%) level of lost X-ray signal. Our method also provides a convenient way to tune the cosmic ray rejection threshold to adapt to a user's specific scientific needs.

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A Generative Model for Realistic Galaxy Cluster X-ray Morphologies

The X-ray morphologies of clusters of galaxies display significant variations, reflecting their dynamical histories and the nonlinear dependence of X-ray emissivity on the density of the intracluster gas. Qualitative and quantitative assessments of X-ray morphology have long been considered a proxy for determining whether clusters are dynamically active or "relaxed." Conversely, the use of circularly or elliptically symmetric models for cluster emission can be complicated by the variety of complex features realized in nature, spanning scales from Mpc down to the resolution limit of current X-ray observatories. In this work, we use mock X-ray images from simulated clusters from THE THREE HUNDRED project to define a basis set of cluster image features. We take advantage of clusters' approximate self similarity to minimize the differences between images before encoding the remaining diversity through a distribution of high order polynomial coefficients. Principal component analysis then provides an orthogonal basis for this distribution, corresponding to natural perturbations from an average model. This representation allows novel, realistically complex X-ray cluster images to be easily generated, and we provide code to do so. The approach provides a simple way to generate training data for cluster image analysis algorithms, and could be straightforwardly adapted to generate clusters displaying specific types of features, or selected by physical characteristics available in the original simulations.

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Optical Photometric Indicators of Galaxy Cluster Relaxation

The most dynamically relaxed clusters of galaxies play a special role in cosmological studies as well as astrophysical studies of the intracluster medium (ICM) and active galactic nucleus feedback. While high spatial resolution imaging of the morphology of the ICM has long been the gold standard for establishing a cluster's dynamical state, such data are not available from current or planned surveys, and thus require separate, pointed follow-up observations. With optical and/or near-IR photometric imaging, and red-sequence cluster finding results from those data, expected to be ubiquitously available for clusters discovered in upcoming optical and mm-wavelength surveys, it is worth asking how effectively photometric data alone can identify relaxed cluster candidates, before investing in, e.g., high-resolution X-ray observations. Here we assess the ability of several simple photometric measurements, based on the redMaPPer cluster finder run on Sloan Digital Sky Survey data, to reproduce X-ray classifications of dynamical state for an X-ray selected sample of massive clusters. We find that two simple metrics contrasting the Bright Central Galaxy (BCG) to other cluster members can identify a complete sample of relaxed clusters with a purity of ~40 per cent in our data set. Including minimal ICM information in the form of a center position increases the purity to ~60 per cent. However, all three metrics depend critically on correctly identifying the BCG, which is presently a challenge for optical red-sequence cluster finders.

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Demonstrating repetitive non-destructive readout (RNDR) with SiSeRO devices

We demonstrate so-called repetitive non-destructive readout (RNDR) for the first time on a Single electron Sensitive Readout (SiSeRO) device. SiSeRO is a novel on-chip charge detector output stage for charge-coupled device (CCD) image sensors, developed at MIT Lincoln Laboratory. This technology uses a p-MOSFET transistor with a depleted internal gate beneath the transistor channel. The transistor source-drain current is modulated by the transfer of charge into the internal gate. RNDR was realized by transferring the signal charge non-destructively between the internal gate and the summing well (SW), which is the last serial register. The advantage of the non-destructive charge transfer is that the signal charge for each pixel can be measured at the end of each transfer cycle and by averaging for a large number of measurements ($\mathrm{N_{cycle}}$), the total noise can be reduced by a factor of 1/$\mathrm{\sqrt{N_{cycle}}}$. In our experiments with a prototype SiSeRO device, we implemented nine ($\mathrm{N_{cycle}}$ = 9) RNDR cycles, achieving around 2 electron readout noise (equivalent noise charge or ENC) with spectral resolution close to the fano limit for silicon at 5.9 keV. These first results are extremely encouraging, demonstrating successful implementation of the RNDR technique in SiSeROs. They also lay foundation for future experiments with more optimized test stands (better temperature control, larger number of RNDR cycles, RNDR-optimized SiSeRO devices) which should be capable of achieving sub-electron noise sensitivities. This new device class presents an exciting technology for next generation astronomical X-ray telescopes requiring very low-noise spectroscopic imagers. The sub-electron sensitivity also adds the capability to conduct in-situ absolute calibration, enabling unprecedented characterization of the low energy instrument response.

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Searching for the Highest-z Dual AGN in the Deepest Chandra Surveys

We present an analysis searching for dual AGN among 62 high-redshift ($2.5 < z < 3.5$) X-ray sources selected from publicly available deep Chandra fields. We aim to quantify the frequency of dual AGN in the high-redshift Universe, which holds implications for black hole merger timescales and low-frequency gravitational wave detection rates. We analyze each X-ray source using BAYMAX, an analysis tool that calculates the Bayes factor for whether a given archival Chandra AGN is more likely a single or dual point source. We find no strong evidence for dual AGN in any individual source in our sample. We then increase our sensitivity to search for dual AGN across the sample by comparing our measured distribution of Bayes factors to that expected from a sample composed entirely of single point sources, and again find no evidence for dual AGN in the observed sample distribution. Although our analysis utilizes one of the largest Chandra catalogs of high-$z$ X-ray point sources available to study, the findings remain limited by the modest number of sources observed at the highest spatial resolution with Chandra and the typical count rates of the detected sources. Our non-detection allows us to place an upper-limit on the X-ray dual AGN fraction between $2.5<z<3.5$ of 4.8\%. Expanding substantially on these results at X-ray wavelengths will require future surveys spanning larger sky areas and extending to fainter fluxes than has been possible with Chandra. We illustrate the potential of the AXIS mission concept in this regard.

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Overview of the Advanced X-ray Imaging Satellite (AXIS)

The Advanced X-ray Imaging Satellite (AXIS) is a Probe-class concept that will build on the legacy of the Chandra X-ray Observatory by providing low-background, arcsecond-resolution imaging in the 0.3-10 keV band across a 450 arcminute$^2$ field of view, with an order of magnitude improvement in sensitivity. AXIS utilizes breakthroughs in the construction of lightweight segmented X-ray optics using single-crystal silicon, and developments in the fabrication of large-format, small-pixel, high readout rate CCD detectors with good spectral resolution, allowing a robust and cost-effective design. Further, AXIS will be responsive to target-of-opportunity alerts and, with onboard transient detection, will be a powerful facility for studying the time-varying X-ray universe, following on from the legacy of the Neil Gehrels (Swift) X-ray observatory that revolutionized studies of the transient X-ray Universe. In this paper, we present an overview of AXIS, highlighting the prime science objectives driving the AXIS concept and how the observatory design will achieve these objectives.

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The high-speed X-ray camera on AXIS

AXIS is a Probe-class mission concept that will provide high-throughput, high-spatial-resolution X-ray spectral imaging, enabling transformative studies of high-energy astrophysical phenomena. To take advantage of the advanced optics and avoid photon pile-up, the AXIS focal plane requires detectors with readout rates at least 20 times faster than previous soft X-ray imaging spectrometers flying aboard missions such as Chandra and Suzaku, while retaining the low noise, excellent spectral performance, and low power requirements of those instruments. We present the design of the AXIS high-speed X-ray camera, which baselines large-format MIT Lincoln Laboratory CCDs employing low-noise pJFET output amplifiers and a single-layer polysilicon gate structure that allows fast, low-power clocking. These detectors are combined with an integrated high-speed, low-noise ASIC readout chip from Stanford University that provides better performance than conventional discrete solutions at a fraction of their power consumption and footprint. Our complementary front-end electronics concept employs state of the art digital video waveform capture and advanced signal processing to deliver low noise at high speed. We review the current performance of this technology, highlighting recent improvements on prototype devices that achieve excellent noise characteristics at the required readout rate. We present measurements of the CCD spectral response across the AXIS energy band, augmenting lab measurements with detector simulations that help us understand sources of charge loss and evaluate the quality of the CCD backside passivation technique. We show that our technology is on a path that will meet our requirements and enable AXIS to achieve world-class science.

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Improved noise performance from the next-generation buried-channel p-Mosfet SiSeROs

The Single electron Sensitive Read Out (SiSeRO) is a novel on-chip charge detector output stage for charge-coupled device (CCD) image sensors. Developed at MIT Lincoln Laboratory, this technology uses a p-MOSFET transistor with a depleted internal gate beneath the transistor channel. The transistor source-drain current is modulated by the transfer of charge into the internal gate. At Stanford, we have developed a readout module based on the drain current of the on-chip transistor to characterize the device. In our earlier work, we characterized a number of first prototype SiSeROs with the MOSFET transistor channels at the surface layer. An equivalent noise charge (ENC) of around 15 electrons root mean square (RMS) was obtained. In this work, we examine the first buried-channel SiSeRO. We have achieved substantially improved noise performance of around 4.5 electrons root mean square (RMS) and a full width half maximum (FWHM) energy resolution of 132 eV at 5.9 keV, for a readout speed of 625 kpixel/s. We also discuss how digital filtering techniques can be used to further improve the SiSeRO noise performance. Additional measurements and device simulations will be essential to further mature the SiSeRO technology. This new device class presents an exciting new technology for the next-generation astronomical X-ray telescopes requiring fast, low-noise, radiation-hard megapixel imagers with moderate spectroscopic resolution.

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SPT-CL J2215-3537: A Massive Starburst at the Center of the Most Distant Relaxed Galaxy Cluster

We present the discovery of the most distant, dynamically relaxed cool core cluster, SPT-CL J2215-3537 (SPT2215) and its central brightest cluster galaxy (BCG) at z=1.16. Using new X-ray observations, we demonstrate that SPT2215 harbors a strong cool core, with a central cooling time of 200 Myr (at 10 kpc) and a maximal intracluster medium cooling rate of 1900+/-400 Msun/yr. This prodigious cooling may be responsible for fueling extended, star-forming filaments observed in Hubble Space Telescope imaging. Based on new spectrophotometric data, we detect bright [O II] emission in the BCG, implying an unobscured star formation rate (SFR) of 320^{+230}_{-140} Msun/yr. The detection of a weak radio source (2.0+/-0.8 mJy at 0.8 GHz) suggests ongoing feedback from an active galactic nucleus (AGN), though the implied jet power is less than half the cooling luminosity of the hot gas, consistent with cooling overpowering heating. The extreme cooling and SFR of SPT2215 is rare among known cool core clusters, and it is even more remarkable that we observe these at such high redshift, when most clusters are still dynamically disturbed. The high mass of this cluster, coupled with the fact that it is dynamically relaxed with a highly-isolated BCG, suggests that it is an exceptionally rare system that must have formed very rapidly in the early Universe. Combined with the high SFR, SPT2215 may be a high-z analog of the Phoenix cluster, potentially providing insight into the limits of AGN feedback and star formation in the most massive galaxies.

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