Sulaiman Al Ghadani | Searcharxiv

arXiv2026

Versatile Sleeve-and-Bulk Fabrication of Inversely Designed Nanophotonic Structures with High Pattern Transfer Fidelity

Inverse design is a powerful computational tool for generating nanophotonic devices that should outperform their traditionally designed counterparts. However, translating these theoretical gains into physical devices is challenging because the irregular and non-intuitive features that make inversely designed structures so effective also make them exceptionally difficult to fabricate, typically necessitating substantial process optimization unique to each device design. We describe a versatile two-step nanofabrication process that achieves pattern transfer fidelity in excess of 90% for each of three distinct inverse device designs with no device-specific process optimization.

physics.optics↗

arXiv2026

Automated Vector-Scanning Spectroscopy for Large-Scale Characterization of Single Quantum Emitters

The inherent spatial randomness and broad spectral heterogeneity of epitaxial quantum dots (QDs) -- one of the most mature classes of solid-state quantum emitters -- remains a major obstacle to their scalable deployment in integrated photonic quantum technologies. Overcoming this challenge requires deterministic fabrication strategies capable of precisely aligning nanophotonic structures with high-quality emitters, which in turn demands efficient and automated single-QD characterization. Despite substantial progress in optical measurement techniques, a platform capable of autonomous, data-efficient, and sufficiently versatile characterization of single quantum dots at the chip scale remains lacking. Here, we introduce an automated cryogenic measurement platform that combines wide-field photoluminescence imaging with vector-stage-scanning confocal spectroscopy to enable high-throughput, chip-scale targeted optical characterization of individual QDs. Using this platform, we automatically acquire photoluminescence data from thousands of GaAs/AlGaAs QDs on a single chip. We demonstrate how this extensive dataset enables identification of high-performance emitters for future deterministic device fabrication, while simultaneously revealing statistical trends across the QD ensemble. By uniting data-efficient targeted measurements with scalable automation, our platform establishes a foundation for large-scale quantum photonic integration and the high throughput characterization framework needed to accelerate materials optimization.

physics.optics↗