Sven-Markus Loorits | Searcharxiv

arXiv2026

CheckOne: Lightweight Fault Detection and Mitigation for Vision Transformers

The wide adoption of Vision Transformers (ViTs) in safety-critical applications raises reliability concerns related to hardware faults. Algorithm-Based Fault Tolerance (ABFT) methods have emerged as lightweight and symmetric protection mechanisms for DNNs. However, they are particularly challenging for ViTs due to their significant computational requirements. This work comprehensively evaluates the reliability of ViTs, emphasizing the need for symmetric protection in their layers. Furthermore, we present CheckOne, a novel, cost-effective method for fault detection and mitigation in ViTs that significantly reduces the computational cost compared to conventional ABFT. Through extensive experiments with multiple ViTs, CheckOne mitigates critical faults by up to $26\times$ and achieves an average 3.8x higher performance than ABFT in ViTs.

cs.AR↗

arXiv2026

Effective and Memory-Efficient Alternatives to ECC for Reliable Large-Scale DNNs

Modern Deep Learning (DL) workloads are increasingly deployed in safety-critical domains, such as automotive systems and hyperscale data centers, where transient hardware faults pose a serious threat to system reliability. These workloads are highly memory-intensive, and their correct functionality strongly depends on model parameters stored in memory, which are typically protected using Error Correction Codes (ECCs). In this work, we study ECC's impact on such models and propose two lightweight alternatives to ECCs that achieve superior reliability. The first approach, MSET, selectively hardens the most vulnerable bits in CNN and ViT parameters, while the second approach, CEP, provides fine-grained protection for all parameter bits. Experimental results demonstrate that both methods significantly enhance the reliability of large CNNs and ViTs, mostly outperforming conventional Single Error Detection Double Error Correction (SECDED) ECC schemes, with no memory overhead and, in fact, with considerably lower area and delay characteristics when compared to SECDEC. Experimental results indicate that ViTs can be effectively protected by merely protecting their highest exponent bits in FP16 and FP32 representations. Furthermore, applying the CEP technique can guarantee the resilience of DNNs by up to one order of magnitude higher BERs, with a 3.5x lower area overhead and 7x faster decoder compared to SECDED ECC.

cs.AR↗