arXiv subjects

T. Waelchli

Publications and source records attributed to T. Waelchli.

3 recordsLinked to original sources

arXiv2007

Track reconstruction in the emulsion-lead target of the OPERA experiment using the ESS microscope

The OPERA experiment, designed to conclusively prove the existence of $\rm ν_μ\to ν_τ$ oscillations in the atmospheric sector, makes use of a massive lead-nuclear emulsion target to observe the appearance of $\rm ν_τ$'s in the CNGS $\rm ν_μ$ beam. The location and analysis of the neutrino interactions in quasi real-time required the development of fast computer-controlled microscopes able to reconstruct particle tracks with sub-micron precision and high efficiency at a speed of 20 cm^2 / h. This paper describes the performance in particle track reconstruction of the European Scanning System, a novel automatic microscope for the measurement of emulsion films developed for OPERA.

physics.ins-det↗

arXiv2006

Hardware performance of a scanning system for high speed analysis of nuclear emulsions

The use of nuclear emulsions in very large physics experiments is now possible thanks to the recent improvements in the industrial production of emulsions and to the development of fast automated microscopes. In this paper the hardware performances of the European Scanning System (ESS) are described. The ESS is a very fast automatic system developed for the mass scanning of the emulsions of the OPERA experiment, which requires microscopes with scanning speeds of about 20 cm^2/h in an emulsion volume of 44 micron thickness.

physics.ins-det↗

arXiv2006

A novel automatic film changer for high-speed analysis of nuclear emulsions

This paper describes the recent development of a novel automatic computer-controlled manipulator for emulsion film placement and removal at the microscope object table (also called stage). The manipulator is designed for mass scanning of emulsion films for the OPERA neutrino oscillation experiment and provides emulsion changing time shorter than 30 seconds with an emulsion film positioning accuracy as good as 20 microns RMS.

physics.ins-det↗