Tae-suk Oh | Searcharxiv

arXiv2017

Estimation of reliable range of electron temperature measurements with sets of given optical bandpass filters for KSTAR Thomson scattering system based on synthetic Thomson data

One factor determining the reliability of measurements of electron temperature using a Thomson scattering (TS) system is transmittance of the optical bandpass filters in polychromators. We investigate the system performance as a function of electron temperature to determine reliable range of measurements for a given set of the optical bandpass filters. We show that such a reliability, i.e., both bias and random errors, can be obtained by building a forward model of the KSTAR TS system to generate synthetic TS data with the prescribed electron temperature and density profiles. The prescribed profiles are compared with the estimated ones to quantify both bias and random errors.

physics.plasm-ph↗

arXiv2015

Quantifying noise sources in the KSTAR 2014 Thomson Scattering system from the measured variation on electron temperature

With the Thomson scattering (TS) system in KSTAR, temporal evolution of electron temperature ($T_e$) is estimated using a weighted look-up table method with fast sampling ($1.25$ or $2.5$ GS/s) digitizers during the 2014 KSTAR campaign. Background noise level is used as a weighting parameter without considering the photon noise due to the absence of information on absolute photon counts detected by the TS system. Estimated electron temperature during a relatively quiescent discharge are scattered, i.e., $15$\% variation on $T_e$ with respect to its mean value. We find that this $15$\% variation on $T_e$ cannot be explained solely by the background noise level which leads us to include photon noise effects in our analysis. Using synthetic data, we have estimated the required photon noise level consistent with the observation and determined the dominant noise source in KSTAR TS system.

physics.plasm-ph↗