arXiv subjects

Takeshi G. Tsuru

Publications and source records attributed to Takeshi G. Tsuru.

At least 19 recordsLinked to original sources

arXiv2025

New CCD Driving Technique to Suppress Anomalous Charge Intrusion from Outside the Imaging Area for Soft X-ray Imager of Xtend onboard XRISM

The Soft X-ray Imager (SXI) is an X-ray CCD camera of the Xtend system onboard the X-Ray Imaging and Spectroscopy Mission (XRISM), which was successfully launched on September 7, 2023 (JST). During ground cooling tests of the CCDs in 2020/2021, using the flight-model detector housing, electronic boards, and a mechanical cooler, we encountered an unexpected issue. Anomalous charges appeared outside the imaging area of the CCDs and intruded into the imaging area, causing pulse heights to stick to the maximum value over a wide region. Although this issue has not occurred in subsequent tests or in orbit so far, it could seriously affect the imaging and spectroscopic performance of the SXI if it were to happen in the future. Through experiments with non-flight-model detector components, we successfully reproduced the issue and identified that the anomalous charges intrude via the potential structure created by the charge injection electrode at the top of the imaging area. To prevent anomalous charge intrusion and maintain imaging and spectroscopic performance that satisfies the requirements, even if this issue occurs in orbit, we developed a new CCD driving technique. This technique is different from the normal operation in terms of potential structure and its changes during imaging and charge injection. In this paper, we report an overview of the anomalous charge issue, the related potential structures, the development of the new CCD driving technique to prevent the issue, the imaging and spectroscopic performance of the new technique, and the results of experiments to investigate the cause of anomalous charges.

astro-ph.IM↗

arXiv2025

Initial operations of the Soft X-ray Imager onboard XRISM

XRISM (X-Ray Imaging and Spectroscopy Mission) is an astronomical satellite with the capability of high-resolution spectroscopy with the X-ray microcalorimeter, Resolve, and wide field-of-view imaging with the CCD camera, Xtend. Xtend consists of the mirror assembly (XMA: X-ray Mirror Assembly) and detector (SXI: Soft X-ray Imager). The SXI is composed of CCDs, analog and digital electronics, and a mechanical cooler. After the successful launch on September 6th, 2023 (UT) and subsequent critical operations, the mission instruments were turned on and set up. The CCDs have been kept at the designed operating temperature of $-110^\circ$C after the electronics and cooling system were successfully set up. During the initial operation phase, which continued for more than a month after the critical operations, we verified the observation procedure, stability of the cooling system, all the observation options with different imaging areas and/or timing resolutions, and time-tagged and automated operations including those for South Atlantic Anomaly passages. We optimized the operation procedure and observation parameters including the cooler settings, imaging areas for the small window modes, and event selection algorithm. We summarize our policy and procedure of the initial operations for the SXI. We also report on a couple of issues we faced during the initial operations and lessons learned from them.

astro-ph.IM↗

arXiv2025

A detailed study on spectroscopic performance of SOI pixel detector with a pinned depleted diode structure for X-ray astronomy

We have been developing silicon-on-insulator (SOI) pixel detectors with a pinned depleted diode (PDD) structure, named "XRPIX", for X-ray astronomy. In our previous study, we successfully optimized the design of the PDD structure, achieving both the suppression of large leakage current and satisfactory X-ray spectroscopic performance. Here, we report a detailed study on the X-ray spectroscopic performance of the XRPIX with the optimized PDD structure. The data were obtained at $-60^\circ\mathrm{C}$ with the "event-driven readout mode", in which only a triggering pixel and its surroundings are read out. The energy resolutions in full width at half maximum at 6.4 keV are $178\pm1$ eV and $291\pm1$ eV for single-pixel and all-pixel event spectra, respectively. The all-pixel events include charge-sharing pixel events as well as the single-pixel events. These values are the best achieved in the history of our development. We argue that the gain non-linearity in the low energy side due to excessive charge injection to the charge-sensitive amplifier is a major factor to limit the current spectroscopic performance. Optimization of the amount of the charge injection is expected to lead to further improvement in the spectroscopic performance of XRPIX, especially for the all-pixel event spectrum.

astro-ph.IM↗

arXiv2024

Feasibility study of upper atmosphere density measurement on the ISS by observations of the CXB transmitted through the Earth rim

Measurements of the upper atmosphere at ~100 km are important to investigate climate change, space weather forecasting, and the interaction between the Sun and the Earth. Atmospheric occultations of cosmic X-ray sources are an effective technique to measure the neutral density in the upper atmosphere. We are developing the instrument SUIM dedicated to continuous observations of atmospheric occultations. SUIM will be mounted on a platform on the exterior of the International Space Station for six months and pointed at the Earth's rim to observe atmospheric absorption of the cosmic X-ray background (CXB). In this paper, we conducted a feasibility study of SUIM by estimating the CXB statistics and the fraction of the non-X-ray background (NXB) in the observed data. The estimated CXB statistics are enough to evaluate the atmospheric absorption of CXB for every 15 km of altitude. On the other hand, the NXB will be dominant in the X-ray spectra of SUIM. Assuming that the NXB per detection area of SUIM is comparable to that of the soft X-ray Imager onboard Hitomi, the NXB level will be much higher than the CXB one and account for ~80% of the total SUIM spectra.

astro-ph.IM↗

arXiv2024

SUIM project: measuring the upper atmosphere from the ISS by observations of the CXB transmitted through the Earth rim

The upper atmosphere at the altitude of 60-110 km, the mesosphere and lower thermosphere (MLT), has the least observational data of all atmospheres due to the difficulties of in-situ observations. Previous studies demonstrated that atmospheric occultation of cosmic X-ray sources is an effective technique to investigate the MLT. Aiming to measure the atmospheric density of the MLT continuously, we are developing an X-ray camera, "Soipix for observing Upper atmosphere as Iss experiment Mission (SUIM)", dedicated to atmospheric observations. SUIM will be installed on the exposed area of the International Space Station (ISS) and face the ram direction of the ISS to point toward the Earth rim. Observing the cosmic X-ray background (CXB) transmitted through the atmosphere, we will measure the absorption column density via spectroscopy and thus obtain the density of the upper atmosphere. The X-ray camera is composed of a slit collimator and two X-ray SOI-CMOS pixel sensors (SOIPIX), and will stand on its own and make observations, controlled by a CPU-embedded FPGA "Zynq". We plan to install the SUIM payload on the ISS in 2025 during the solar maximum. In this paper, we report the overview and the development status of this project.

astro-ph.IM↗

arXiv2024

Design study and spectroscopic performance of SOI pixel detector with a pinned depleted diode structure for X-ray astronomy

We have been developing silicon-on-insulator (SOI) pixel detectors with a pinned depleted diode (PDD) structure, named "XRPIX", for X-ray astronomy. The PDD structure is formed in a thick p-type substrate, to which high negative voltage is applied to make it fully depleted. A pinned p-well is introduced at the backside of the insulator layer to reduce a dark current generation at the Si-SiO$_{2}$ interface and to fix the back-gate voltage of the SOI transistors. An n-well is further introduced between the p-well and the substrate to make a potential barrier between them and suppress a leakage current. An optimization study on the n-well dopant concentration is necessary because a higher dopant concentration could result in a higher potential barrier but also in a larger sense-node capacitance leading to a lower spectroscopic performance, and vice versa. Based on a device simulation, we fabricated five candidate chips having different n-well dopant concentrations. We successfully found out the best n-well design, which suppressed a large leakage current and showed satisfactory X-ray spectroscopic performance. Too low and too high n-well dopant concentration chips showed a large leakage current and degraded X-ray spectroscopic performance, respectively. We also found that the dependency of X-ray spectroscopic performance on the n-well dopant concentration can be largely explained by the difference in sense-node capacitance.

astro-ph.IM↗

arXiv2023

Radiation-Induced Degradation Mechanism of X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure

The X-ray Silicon-On-Insulator (SOI) pixel sensor named XRPIX has been developed for the future X-ray astronomical satellite FORCE. XRPIX is capable of a wide-band X-ray imaging spectroscopy from below 1 keV to a few tens of keV with a good timing resolution of a few tens of $μ$s. However, it had a major issue with its radiation tolerance to the total ionizing dose (TID) effect because of its thick buried oxide layer due to the SOI structure. Although new device structures introducing pinned depleted diodes dramatically improved radiation tolerance, it remained unknown how radiation effects degrade the sensor performance. Thus, this paper reports the results of a study of the degradation mechanism of XRPIX due to radiation using device simulations. In particular, mechanisms of increases in dark current and readout noise are investigated by simulation, taking into account the positive charge accumulation in the oxide layer and the increase in the surface recombination velocity at the interface between the sensor layer and the oxide layer. As a result, it is found that the depletion of the buried p-well at the interface increases the dark current, and that the increase in the sense-node capacitance increases the readout noise.

astro-ph.IM↗

arXiv2023

A broadband X-ray imaging spectroscopy in the 2030s: the FORCE mission

In this multi-messenger astronomy era, all the observational probes are improving their sensitivities and overall performance. The Focusing on Relativistic universe and Cosmic Evolution (FORCE) mission, the product of a JAXA/NASA collaboration, will reach a 10 times higher sensitivity in the hard X-ray band ($E >$ 10~keV) in comparison with any previous hard X-ray missions, and provide simultaneous soft X-ray coverage. FORCE aims to be launched in the early 2030s, providing a perfect hard X-ray complement to the ESA flagship mission Athena. FORCE will be the most powerful X-ray probe for discovering obscured/hidden black holes and studying high energy particle acceleration in our Universe and will address how relativistic processes in the universe are realized and how these affect cosmic evolution. FORCE, which will operate over 1--79 keV, is equipped with two identical pairs of supermirrors and wideband X-ray imagers. The mirror and imager are connected by a high mechanical stiffness extensible optical bench with alignment monitor systems with a focal length of 12~m. A light-weight silicon mirror with multi-layer coating realizes a high angular resolution of $<15''$ in half-power diameter in the broad bandpass. The imager is a hybrid of a brand-new SOI-CMOS silicon-pixel detector and a CdTe detector responsible for the softer and harder energy bands, respectively. FORCE will play an essential role in the multi-messenger astronomy in the 2030s with its broadband X-ray sensitivity.

astro-ph.HE↗

arXiv2022

Single Event Tolerance of X-ray SOI Pixel Sensors

We evaluate the single event tolerance of the X-ray silicon-on-insulator (SOI) pixel sensor named XRPIX, developed for the future X-ray astronomical satellite FORCE. In this work, we measure the cross-section of single event upset (SEU) of the shift register on XRPIX by irradiating heavy ion beams with linear energy transfer (LET) ranging from 0.022 MeV/(mg/cm2) to 68 MeV/(mg/cm2). From the SEU cross-section curve, the saturation cross-section and threshold LET are successfully obtained to be $3.4^{+2.9}_{-0.9}\times 10^{-10}~{\rm cm^2/bit}$ and $7.3^{+1.9}_{-3.5}~{\rm MeV/(mg/cm^2)}$, respectively. Using these values, the SEU rate in orbit is estimated to be $\lesssim$ 0.1 event/year primarily due to the secondary particles induced by cosmic-ray protons. This SEU rate of the shift register on XRPIX is negligible in the FORCE orbit.

astro-ph.IM↗

arXiv2022

X-ray Radiation Damage Effects on Double-SOI Pixel Detectors for the Future Astronomical Satellite "FORCE"

We have been developing the monolithic active pixel detector "XRPIX" onboard the future X-ray astronomical satellite "FORCE". XRPIX is composed of CMOS pixel circuits, SiO2 insulator, and Si sensor by utilizing the silicon-on-insulator (SOI) technology. When the semiconductor detector is operated in orbit, it suffers from radiation damage due to X-rays emitted from the celestial objects as well as cosmic rays. From previous studies, positive charges trapped in the SiO2 insulator are known to cause the degradation of the detector performance. To improve the radiation hardness, we developed XRPIX equipped with Double-SOI (D-SOI) structure, introducing an additional silicon layer in the SiO2 insulator. This structure is aimed at compensating for the effect of the trapped positive charges. Although the radiation hardness to cosmic rays of the D-SOI detectors has been evaluated, the radiation effect due to the X-ray irradiation has not been evaluated. Then, we conduct an X-ray irradiation experiment using an X-ray generator with a total dose of 10 krad at the SiO2 insulator, equivalent to 7 years in orbit. As a result of this experiment, the energy resolution in full-width half maximum for the 5.9 keV X-ray degrades by 17.8 $\pm$ 2.8% and the dark current increases by 89 $\pm$ 13%. We also investigate the physical mechanism of the increase in the dark current due to X-ray irradiation using TCAD simulation. It is found that the increase in the dark current can be explained by the increase in the interface state density at the Si/SiO2 interface.

astro-ph.IM↗

arXiv2021

Proton radiation hardness of X-ray SOI pixel sensors with pinned depleted diode structure

X-ray SOI pixel sensors, "XRPIX", are being developed for the next-generation X-ray astronomical satellite, "FORCE". The XRPIX are fabricated with the SOI technology, which makes it possible to integrate a high-resistivity Si sensor and a low-resistivity Si CMOS circuit. The CMOS circuit in each pixel is equipped with a trigger function, allowing us to read out outputs only from the pixels with X-ray signals at the timing of X-ray detection. This function thus realizes high throughput and high time resolution, which enables to employ anti-coincidence technique for background rejection. A new series of XRPIX named XRPIX6E developed with a pinned depleted diode (PDD) structure improves spectral performance by suppressing the interference between the sensor and circuit layers. When semiconductor X-ray sensors are used in space, their spectral performance is generally degraded owing to the radiation damage caused by high-energy protons. Therefore, before using an XRPIX in space, it is necessary to evaluate the extent of degradation of its spectral performance by radiation damage. Thus, we performed a proton irradiation experiment for XRPIX6E for the first time at HIMAC in the NIRS. We irradiated XRPIX6E with high-energy protons with a total dose of up to 40 krad, equivalent to 400 years of irradiation in orbit. The 40-krad irradiation degraded the energy resolution of XRPIX6E by 25 $\pm$ 3%, yielding an energy resolution of 260.1 $\pm$ 5.6 eV at the full width half maximum for 5.9 keV X-rays. However, the value satisfies the requirement for FORCE, 300 eV at 6 keV, even after the irradiation. It was also found that the PDD XRPIX has enhanced radiation hardness compared to previous XRPIX devices. In addition, we investigated the degradation of the energy resolution; it was shown that the degradation would be due to increasing energy-independent components, e.g., readout noise.

astro-ph.IM↗

arXiv2020

Experimental studies on the charge transfer inefficiency of CCD developed for the soft X-ray imaging telescope Xtend aboard the XRISM satellite

We present experimental studies on the charge transfer inefficiency (CTI) of charge-coupled device (CCD) developed for the soft X-ray imaging telescope, Xtend, aboard the XRISM satellite. The CCD is equipped with a charge injection (CI) capability, in which sacrificial charge is periodically injected to fill the charge traps. By evaluating the re-emission of the trapped charge observed behind the CI rows, we find that there are at least three trap populations with different time constants. The traps with the shortest time constant, which is equivalent to a transfer time of approximately one pixel, are mainly responsible for the trailing charge of an X-ray event seen in the following pixel. A comparison of the trailing charge in two clocking modes reveals that the CTI depends not only on the transfer time but also on the area, namely the imaging or storage area. We construct a new CTI model with taking into account with both transfer-time and area dependence. This model reproduces the data obtained in both clocking modes consistently. We also examine apparent flux dependence of the CTI observed without the CI technique. The higher incident X-ray flux is, the lower the CTI value becomes. It is due to a sacrificial charge effect by another X-ray photon. This effect is found to be negligible when the CI technique is used.

astro-ph.IM↗

arXiv2020

Radiation Damage Effects on Double-SOI Pixel Sensors for X-ray Astronomy

The X-ray SOI pixel sensor onboard the FORCE satellite will be placed in the low earth orbit and will consequently suffer from the radiation effects mainly caused by geomagnetically trapped cosmic-ray protons. Based on previous studies on the effects of radiation on SOI pixel sensors, the positive charges trapped in the oxide layer significantly affect the performance of the sensor. To improve the radiation hardness of the SOI pixel sensors, we introduced a double-SOI (D-SOI) structure containing an additional middle Si layer in the oxide layer. The negative potential applied on the middle Si layer compensates for the radiation effects, due to the trapped positive charges. Although the radiation hardness of the D-SOI pixel sensors for applications in high-energy accelerators has been evaluated, radiation effects for astronomical application in the D-SOI sensors has not been evaluated thus far. To evaluate the radiation effects of the D-SOI sensor, we perform an irradiation experiment using a 6-MeV proton beam with a total dose of ~ 5 krad, corresponding to a few tens of years of in-orbit operation. This experiment indicates an improvement in the radiation hardness of the X- ray D-SOI devices. On using an irradiation of 5 krad on the D-SOI device, the energy resolution in the full-width half maximum for the 5.9-keV X-ray increases by 7 $\pm$ 2%, and the chip output gain decreases by 0.35 $\pm$ 0.09%. The physical mechanism of the gain degradation is also investigated; it is found that the gain degradation is caused by an increase in the parasitic capacitance due to the enlarged buried n-well.

physics.ins-det↗

arXiv2020

Optical Blocking Performance of CCDs Developed for the X-ray Astronomy Satellite XRISM

We have been developing P-channel Charge-Coupled Devices (CCDs) for the upcoming X-ray Astronomy Satellite XRISM, planned to be launched in 2021. While the basic design of the CCD camera (Soft X-ray Imager: SXI) is almost the same as that of the lost Hitomi (ASTRO-H) observatory, we are planning to reduce the "light leakages" that is one of the largest problems recognized in Hitomi data. We adopted a double-layer optical blocking layer on the XRISM CCDs and also added an extra aluminum layer on the backside of them. We develop a newly designed test sample CCD and irradiate it with optical light to evaluate the optical blocking performance. As a result, light leakages are effectively reduced compared with that of the Hitomi CCDs. We thus conclude that the issue is solved by the new design and that the XRISM CCDs satisfy the mission requirement for the SXI.

astro-ph.IM↗

arXiv2020

Development of the detector simulation framework for the Wideband Hybrid X-ray Imager onboard FORCE

FORCE is a Japan-US space-based astronomy mission for an X-ray imaging spectroscopy in an energy range of 1--80 keV. The Wideband Hybrid X-ray Imager (WHXI), which is the main focal plane detector, will use a hybrid semiconductor imager stack composed of silicon and cadmium telluride (CdTe). The silicon imager will be a certain type of the silicon-on-insulator (SOI) pixel sensor, named the X-ray pixel (XRPIX) series. Since the sensor has a small pixel size (30--36 $μ$m) and a thick sensitive region (300--500 $μ$m), understanding the detector response is not trivial and is important in order to optimize the camera design and to evaluate the scientific capabilities. We have developed a framework to simulate observations of celestial sources with semiconductor sensors. Our simulation framework was tested and validated by comparing our simulation results to laboratory measurements using the XRPIX 6H sensor. The simulator well reproduced the measurement results with reasonable physical parameters of the sensor including an electric field structure, a Coulomb repulsion effect on the carrier diffusion, and arrangement of the degraded regions. This framework is also applicable to future XRPIX updates including the one which will be part of the WHXI, as well as various types of semiconductor sensors.

astro-ph.IM↗

arXiv2019

Radiation hardness of a p-channel notch CCD developed for the X-ray CCD camera onboard the XRISM satellite

We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel. The new device was exposed up to approximately $7.9 \times 10^{10} \mathrm{~protons~cm^{-2}}$ at 100 MeV. The charge transfer inefficiency was estimated as a function of proton fluence with an ${}^{55} \mathrm{Fe}$ source. A device without the notch structure was also examined for comparison. The result shows that the notch device has a significantly higher radiation hardness than those without the notch structure including the device adopted for Hitomi. This proves that the new CCD is radiation tolerant for space applications with a sufficient margin.

astro-ph.IM↗

arXiv2019

Measurement of Charge Cloud Size in X-ray SOI Pixel Sensors

We report on a measurement of the size of charge clouds produced by X-ray photons in X-ray SOI (Silicon-On-Insulator) pixel sensor named XRPIX. We carry out a beam scanning experiment of XRPIX using a monochromatic X-ray beam at 5.0 keV collimated to $\sim 10$ $μ$m with a 4-$μ$m$ϕ$ pinhole, and obtain the spatial distribution of single-pixel events at a sub-pixel scale. The standard deviation of charge clouds of 5.0 keV X-ray is estimated to be $σ_{\rm cloud} = 4.30 \pm 0.07$ $μ$m. Compared to the detector response simulation, the estimated charge cloud size is well explained by a combination of photoelectron range, thermal diffusion, and Coulomb repulsion. Moreover, by analyzing the fraction of multi-pixel events in various energies, we find that the energy dependence of the charge cloud size is also consistent with the simulation.

astro-ph.IM↗

arXiv2019

Subpixel Response of SOI Pixel Sensor for X-ray Astronomy with Pinned Depleted Diode: First Result from Mesh Experiment

We have been developing a monolithic active pixel sensor, ``XRPIX``, for the Japan led future X-ray astronomy mission ``FORCE`` observing the X-ray sky in the energy band of 1-80 keV with angular resolution of better than 15``. XRPIX is an upper part of a stack of two sensors of an imager system onboard FORCE, and covers the X-ray energy band lower than 20 keV. The XRPIX device consists of a fully depleted high-resistivity silicon sensor layer for X-ray detection, a low resistivity silicon layer for CMOS readout circuit, and a buried oxide layer in between, which is fabricated with 0.2 $μ$ m CMOS silicon-on-insulator (SOI) technology. Each pixel has a trigger circuit with which we can achieve a 10 $μ$ s time resolution, a few orders of magnitude higher than that with X-ray astronomy CCDs. We recently introduced a new type of a device structure, a pinned depleted diode (PDD), in the XRPIX device, and succeeded in improving the spectral performance, especially in a readout mode using the trigger function. In this paper, we apply a mesh experiment to the XRPIX devices for the first time in order to study the spectral response of the PDD device at the subpixel resolution. We confirmed that the PDD structure solves the significant degradation of the charge collection efficiency at the pixel boundaries and in the region under the pixel circuits, which is found in the single SOI structure, the conventional type of the device structure. On the other hand, the spectral line profiles are skewed with low energy tails and the line peaks slightly shift near the pixel boundaries, which contribute to a degradation of the energy resolution.

astro-ph.IM↗