arXiv subjects

Tamazouzt Chennit

Publications and source records attributed to Tamazouzt Chennit.

5 recordsLinked to original sources

arXiv2026

Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl

Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be recorded before the electron beam irreversibly modifies the specimen. Here, sodium chloride (NaCl) is employed as a model beam-sensitive ionic crystal to investigate beam-induced structural evolution and the low-dose regime in which useful structural information can be recovered prior to significant damage. Four-dimensional STEM (4D-STEM) datasets were acquired at 200 kV using a Timepix3 direct electron detector and reconstructed using real-time integrated centre of mass (riCoM) imaging. We first establish the characteristic damage behavior of NaCl under high electron doses. Across different dwell times and raster scan orientations, damage develops reproducibly into square-faceted voids whose boundaries align with the 100 crystallographic directions of the rock-salt lattice, indicating that the morphology is governed predominantly by the intrinsic crystallography rather than the scan geometry. We then investigate the low-dose imaging regime using dose-fractionated acquisitions. At 130 e-A-2 per frame, normalized cross-correlation with respect to the first frame quantitatively tracks progressive structural degradation and enables the onset of measurable damage to be identified as a function of accumulated dose. A subsequent acquisition at 32 e-A-2 per frame demonstrates that atomic-scale spatial information can still be recovered below this damage threshold. These results demonstrate how dose-efficient 4D-STEM acquisition combined with riCoM imaging can extend the accessible imaging regime of highly beam-sensitive ionic materials while preserving atomic-scale information.

physics.app-ph↗

arXiv2026

Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography

By profiting from recent developments in detector technologies, making it possible to access a stream of detection events with few-ns time resolutions, a new ptychographic workflow is established. This methodological framework, referred to as guided progressive reconstructive imaging, relies on a quantization-based description of the acquired intensity, through an elementary derivation. Established direct phase retrieval solutions, such as the Wigner distribution deconvolution approach, can then be adapted to a continuous treatment of received counts, with no need for a dense data representation. Consequently, the result is obtained in the form of a progressively improving estimate, while providing immediate user feedback thanks to a processing speed high enough to surpass the acquisition bandwidth. This fast measurement is enabled by the cumulative usage of a pre-calculated library of kernel-limited functions, accumulating count-wise contributions as a function of the triggered detector pixel. Hence, the reconstruction offers the same advantages of direct phase retrieval methods, in particular a high dose-efficiency and the absence of complex convergence dynamics, with much less stringent restrictions on the field of view than is typical in current alternatives. Its implementation is also significantly more straightforward and flexible. Overall, this work constitutes a major evolution in the state-of-the-art, facilitating repeatable and low-dose experiments with high accessibility, and being applicable to electron-based imaging, X-ray diffraction and optical microscopy.

physics.app-ph↗

arXiv2026

Designing dislocation-driven polar vortex networks in twisted perovskites

Twisting two atomic layers produces a geometric moire pattern, but bonding-induced interfacial reconstruction fundamentally transforms this into an ordered dislocation network - a distinction obscured in weakly-bonded van der Waals systems. Although in-plane topological vortex nanostructures arising from twisting-induced lateral strain modulation have been linked to periodic moire patterns in freestanding perovskite layers and 2D bilayers, their coupling to the interfacial dislocation network in twisted layers remains unresolved. Here we demonstrate that twisting freestanding SrTiO3 layers undergo interfacial reconstruction into a network of screw dislocations, accompanied by the emergence of in-plane topological vortices. Unlike in previous reports, these vortices are associated with the periodicity of the dislocation network rather than with geometric moire patterns. Four-dimensional scanning transmission electron microscopy (4D-STEM) reveals long-range ordered vortex-antivortex arrays with nearly continuous polarisation rotation. A machine-learning interatomic potential, trained on first-principles calculations, together with phase-field modelling, confirms that competing strains within the dislocation network stabilize polar vortex-antivortex pairs and drive the emergence of an electronic superlattice with a well-defined periodicity. Our results establish twist-controlled dislocation networks as a new and versatile route to designing local polar and electronic structures in oxide materials.

cond-mat.mtrl-sci↗

arXiv2025

Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imaging

This study investigates the convergence properties of a collection of iterative electron ptychography methods, under low electron doses ($<$ 10$^3$ $e^-/A^2$) and gives particular attention to the impact of the user-defined update strengths. We demonstrate that carefully chosen values for this parameter, ideally smaller than those conventionally met in the literature, are essential for achieving accurate reconstructions of the projected electrostatic potential. Using a 4D dataset of a thin hybrid organic-inorganic formamidinium lead bromide (FAPbBr$_{3}$) sample, we show that convergence is in practice achievable only when the update strengths for both the object and probe are relatively small compared to what is found in literature. Additionally we demonstrate that under low electron doses, the reconstructions initial error increases when the update strength coefficients are reduced below a certain threshold emphasizing the existence of critical values beyond which the algorithms are trapped in local minima. These findings highlight the need for carefully optimized reconstruction parameters in iterative ptychography, especially when working with low electron doses, ensuring both effective convergence and correctness of the result.

cond-mat.mtrl-sci↗

arXiv2023

Phase offset method of ptychographic contrast reversal correction

The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing away from the entrance surface is often undesirable as this degrades the annular dark field (ADF) signal. Here we discuss how phase wrap asymptotes in the frequency response of SSB ptychography give rise to contrast reversals, without the need for dynamical scattering, and how these can be counteracted by manipulating the phases such that the asymptotes are either shifted to higher frequencies or damped via amplitude modulation. This is what enables post collection defocus correction of contrast reversals. However, the phase offset method of counteracting contrast reversals we introduce here is generally found to be superior to post collection application of defocus, with greater reliability and generally stronger contrast. Importantly, the phase offset method also works for thin and thick samples where central focusing does not. Finally, the independence of the method from focus is useful for optical sectioning involving ptychography, improving interpretability by better disentangling the effects of strong potentials and focus.

physics.optics↗