arXiv subjects

Thomas J. Ferron

Publications and source records attributed to Thomas J. Ferron.

2 recordsLinked to original sources

arXiv2026

Kinetically-Arrested Phase Separation leads to Tunable Domain Structures in Vapor-Deposited Glasses

The characteristic length scale of phase-separated organic thin film blends is a critical structural parameter governing the performance and functionality of organic electronic devices. The arrested morphologies of vapor-deposited organic thin films result from the interplay between thermodynamic driving forces and kinetic constraints during deposition. Here, we aim to isolate the role of kinetic effects in phase separation by varying the deposition rate at a constant substrate temperature for a co-deposited molecular glass blend of N,N'-bis(3-methylphenyl)-N,N'-diphenylbenzidine (TPD) and Disperse Orange 37 (DO37). The dependence of morphology on deposition rate is quantified using power spectral density (PSD) analysis of atomic force microscopy (AFM) images. Two distinct deposition rate-dependent length scales at the surface reveal how deposition kinetics directly influence domain size and film topography. Complementary Resonant Soft X-ray Scattering (RSoXS) measurements indicate that phase separation extends throughout the film thickness. These observations are consistent with the surface equilibration mechanism previously described for homogeneous vapor-deposited films, in which enhanced surface mobility allows molecules in the growing film to partially equilibrate into distinct surface-templated states during deposition. In the current work, this mechanism allows the multi-component blend to phase separate and coarsen into a structure with multiple length scales before kinetically arresting to an extent that depends on the deposition rate. The demonstration of finely tunable domain size with deposition rate provides strategies to design new organic electronic devices with desired morphologies.

cond-mat.mtrl-sci↗

arXiv2024

Resonant soft X-ray scattering reveals hierarchical structure in a multi-component vapor-deposited glass

Multi-phase vapor-deposited glasses are an important class of materials for organic electronics, particularly organic photovoltaics and thermoelectrics. These blends are frequently regarded as molecular alloys and there have been few studies of their structure at nanometer scales. Here we show that a co-deposited system of TPD and Disperse Orange 37, two small molecule glass-formers, separates into compositionally distinct phases with a domain size and spacing that depends on substrate temperature during deposition. Domains rich in one of the two components become larger and more pure at higher deposition temperatures. We use resonant soft X-ray scattering (RSoXS) complemented with Atomic Force Microscopy (AFM) and photo-induced force microscopy (PiFM) to measure the phase separation, topography, and purity of the deposited films. A forward-simulation approach to RSoXS analysis, the National Institute of Standards and Technology (NIST) RSoXS Simulation Suite (NRSS), is used with models developed from AFM images to evaluate the energy dependence of scattering across multiple length scales and interpret the RSoXS with respect to structure within the films. We find that the RSoXS is sensitive to a hidden length scale of phase separation that is not apparent from the AFM characterization alone. We demonstrate that vacuum scattering, which is often ignored in RSoXS analysis, contributes significantly to the features and energy dependence of the RSoXS pattern, and then illustrate how to properly account for vacuum scattering to analyze films with significant roughness. We then use this analysis framework to understand structure development mechanisms that occur during vapor deposition of a TPD-DO37 co-deposited glass with results that outline paths to tune morphology in multi-component materials.

cond-mat.mtrl-sci↗