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Tinglan Li

Publications and source records attributed to Tinglan Li.

3 recordsLinked to original sources

Intrinsic Gaps in the Classical Theory of p-n Junctions

The classical analytical theory of p-n junctions successfully describes minority-carrier injection and predicts the ideal diode characteristic, but its conventional reduced formulation leaves the connection between internal transport and terminal response incompletely resolved. This paper critically examines five interrelated gaps in that formulation: the electrostatic justification of charge quasi-neutrality, the determination of the quasi-neutral-region electric field, the explicit treatment of majority-carrier transport, the spatial reconciliation of electron and hole currents, and the evaluation of terminal current from the resolved local transport. A review of representative foundational, textbook, and research treatments distinguishes recognition of individual issues from their integration into a self-consistent analytical description. The central finding is that these gaps constitute a common analytical closure problem: carrier densities, the internal field, and current partition must be determined consistently rather than treated as separate elements. This diagnosis concerns the reduced analytical description, not the validity of the underlying drift-diffusion equations or charge conservation. A two-carrier framework is outlined in which electrostatic consistency, coupled transport, and junction-edge and contact conditions connect local current balance to terminal response. The objective is to preserve the classical diode equation within its established domain while making its physical basis and approximation limits explicit.

physics.app-ph↗

A Self-Consistent Two-Carrier Drift-Diffusion Framework for p-n Junctions: Extended Diode Equation, Power Dissipation, and Base Transit Time

The classical theory of p-n junctions derives the current-voltage characteristic from minority-carrier diffusion alone: majority carriers are treated as an inert background, the quasi-neutral base as field-free, and the junction voltage as equal to the applied bias. These premises fail together under high bias and high-level injection, where the observed current roll-off is reproduced only by appending an empirical series resistance outside the junction physics. Here we develop a self-consistent two-carrier drift-diffusion framework that introduces no assumption beyond the classical ones. Excess majority carriers are shown to be electrostatically forced transport participants: the ambipolar diffusion equation, closed by exact two-sided boundary conditions, yields a unified excess-carrier profile. The resulting base field separates into an ohmic and a Dember component, and all four current components follow in closed form, their sum being position independent. At device level the framework closes into an extended diode equation that contains the Shockley equation as its low-injection, long-base limit and reproduces the n=2 roll-off intrinsically. The junction voltage emerges as a self-limiting drop confined to the space-charge region and separated from the applied bias by exact base drops. Two device-level corrections are quantified: at high current, 75-90% of the dissipation migrates from the junction into the quasi-neutral base, and field-assisted acceleration shortens the base transit time by up to a factor of six. Three parameter-free predictions follow: a universal ideality-factor crossover that passes through 3/2 when the boundary excess equals the doping, a high-injection onset voltage that scales as 119 mV per decade of doping, and a geometry factor that survives into high injection.

cond-mat.mes-hall↗

The Extended Diode Equation

For more than 75 years, the p-n junction current-voltage characteristic has been derived by treating majority carriers as an inert background and conflating the junction voltage with the applied bias. Here we show that the base electric field, generated by the coupling of excess majority and minority carriers, fundamentally alters the internal potential distribution. This self-consistent framework yields a closed-form extended diode equation that reproduces the high-injection roll-off without invoking an external series resistance, thereby eliminating an empirical patch that has persisted in the classical theory.

cond-mat.mes-hall↗