Automated Spin Readout Signal Analysis Using U-Net with Variable-Length Traces and Experimental Noise
Single-shot spin-state discrimination is essential for semiconductor spin qubits, but conventional threshold-based analysis of spin readout traces becomes unreliable under noisy conditions. Although recent neural-network-based methods improve robustness against experimental noise, they are sensitive to training conditions, restricted to fixed-length inputs, and limited to trace-level outputs without explicit temporal localization of transition events. In this work, we apply a U-Net architecture to spin readout signal analysis by formulating transition-event detection as a point-wise segmentation task in one-dimensional time-series data. The fully convolutional structure enables direct processing of variable-length traces. Point-wise and sample-wise evaluations demonstrate low readout error rates and high classification accuracy without retraining. The proposed method generalizes well to previously-unseen trace lengths and experimental non-Gaussian noise, outperforming a conventional threshold-based approach and providing a robust and practical solution for automated spin readout signal analysis.