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Toshiki Makimoto

Publications and source records attributed to Toshiki Makimoto.

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Transient Pauli blocking in a InN film as a mechanism for broadband ultrafast optical switching

The transient Pauli blocking effect offers a promising route for achieving ultrafast optical switching in semiconductors, enabling a rapid switching from an initially opaque state to a relatively transparent state upon photoexcitation. Herein, we demonstrate broadband ultrafast optical switching in degenerate InN thin films, spanning the visible to near-infrared spectral range, using pump-probe transient transmittance measurements. To elucidate the underlying physical mechanism, we perform probe-energy-resolved analysis for ultrafast dynamics, and develop a theoretical model based on a quasi-equilibrium Fermi-Dirac distribution. The model successfully captures the experimental transients and yields an electron-phonon coupling constant of $1.0\times10^{17}\,\mathrm{W\,m^{-3}\,K^{-1}}$, along with an electronic specific heat coefficient ranging from 1.52 to 2.02 $\mathrm{mJ\,mol^{-1}\,K^{-2}}$, which allow direct prediction of the spectral switching window. Notably, we demonstrate that the Pauli blocking effect can be induced solely by a laser-excitation driven rise in electronic temperature, without requiring significant carrier injection into the conduction band in degenerate semiconductors. These findings offer new insights for designing ultrafast optical modulators, shutters, and photonic devices for next-generation communication and computing technologies.

physics.optics

Ultrafast dynamics of electronic structure in InN thin film

Simultaneous measurements of transient transmission and reflectivity were performed in the unintentionally doped InN film to reveal ultrafast optical bleaching and its recovery behavior under intense laser irradiation. The optical bleaching is attributed to Pauli blocking due to the occupation of photoexcited electrons at the probing energy level. The time constant for the transition from the excitation state to the conduction band edge is $\sim$260 fs. The interplay between band filling and band gap renormalization caused by electron-hole and electron-electron interactions gives rise to complex spectral characteristics of transient reflectivity, from which the time constants of photoexcited electron-hole direct recombination and band edge recombination are extracted as $\sim$60 fs and 250$\sim$400 fs, respectively. Our results also reveal that the electron-electron interaction suppresses band edge recombination, and mitigates the recovery process. Our experiments highlight the controllability of the band structure of semiconductors by intense laser irradiation.

physics.optics