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Upasana Baishya

Publications and source records attributed to Upasana Baishya.

3 recordsLinked to original sources

Extreme Cross-polarization Extinction Method for Quantification of Residual Crystal Anisotropy

The high-extinction cross-polarization measurement of a paraxial laser beam results in a Hermite-Gaussian ($\text{HG}_{11}$)-like four-lobes with a dark-centered cross pattern. The azimuthally spin-separated mode pattern is understood to result from the spin-orbit interaction of light. The perfect dark region at the beam center, due to extreme cross-polarization extinction (EXE), is used here to accurately determine the on-axis residual polarization of the laser beam and, using it, the residual elliptical birefringence of optical crystals. By propagating the laser beam through uniaxial optical crystals with their optic axis cut either parallel or perpendicular to the beam propagation direction and performing the EXE measurement, we demonstrate a simple approach to precisely quantify the residual elliptical birefringence of crystals, which are otherwise assumed to be absent, to a high degree of extinction of 1 part in $10^{-8}$. The experimental results are interpreted using Jones-matrix-based calculations for a paraxial laser beam and upon its propagation through the optical crystals. The high sensitivity and high accuracy of the EXE technique make it well-suited for measuring and characterizing anisotropy and its dispersion of monolayers, ultrathin films, and 2D materials.

physics.optics↗

Spin-orbit Interaction-mediated Measurement of Surface Chirality

The spin-orbit interaction in a focused-reflected beam of light results in spatially non-uniform polarization in the beam cross-section due to the superposition of orthogonal field components and polarization-dependent interface reflection coefficients. Polarization filtering the output beam leads to an interchangeable transformation of - or + 2 charge vortex into two - or + unit charge vortices, for + or - circular polarization of the input Gaussian beam. This transformation follows a trajectory, named optical vortex trajectory, that depend on the input beam spin and hence the vortex charge and reflecting surface characteristics. The OVT is used here to quantify both the sign and the magnitude of the chiral parameter of a quartz crystal. The Jones matrix-based simulation anticipates the chirality-dependent OVT that matches with experimental measurements.

physics.optics↗

Optical Singularity Dynamics and Spin-Orbit Interaction due to a Normal-Incident Optical Beam Reflected at a Plane Dielectric Interface

The degenerate case of normal incidence and reflection of an optical beam (both paraxial and non-paraxial) at a plane isotropic dielectric interface, which is azimuthally symmetric in terms of the momentum-spatial variation of Fresnel coefficients but not in terms of the fundamental polarization inhomogeneity of the incident field, requires in-depth analyses. In this paper, we use the reflection and transmission coefficient matrix formalism to derive an exact field expression of a normal-reflected diverging beam. The availability of the exact field information allows controlled variations of the system parameters, leading to significant dynamics of phase and polarization singularities hitherto unanticipated in the literature. We carry out a detailed exploration of these dynamics in our simulated system, and also verify them experimentally by using an appropriate setup. We then use Barnett's formalism to determine the associated orbital angular momentum (OAM) fluxes, leading to a subtle interpretation and mathematical characterization of spin-orbit interaction (SOI) in the system. Our work thus represents a non-trivial unification of the most fundamental electromagnetic reflection/transmission problem at a plane dielectric interface and the emerging areas of optical singularity dynamics with their understanding in terms of OAM flux and SOI. The normal-incidence--retro-reflection geometry being especially amenable to applications, these beam-field phenomena are anticipated to have applications in interface characterization, particle rotation/manipulation and other nano-optical processes.

physics.optics↗