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V M Chacko

Publications and source records attributed to V M Chacko.

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On a new PGDUS transformed model using Inverse Weibull distribution

The Power Generalized DUS (PGDUS) Transformation is significant in reliability theory, especially for analyzing parallel systems. From the Generalized Extreme Value distribution, Inverse Weibull model particularly has wide applicability in statistics and reliability theory. In this paper we consider PGDUS transformation of Inverse Weibull distribution. The basic statistical characteristics of the new model are derived, and unknown parameters are estimated using Maximum likelihood and Maximum product of spacings methods. Simulation analysis and the reliability parameter P(T2 < T1) are explored. The effectiveness of the model in fitting a real-world dataset is demonstrated, showing better performance compared to other competing distributions.

stat.ME

On ageing properties of lifetime distributions

A reasonable segment of reliability theory is perpetrated to the study of failure rates, their properties, connections and applications. The present study focused on failure rate distributions and their shape properties. Failure rates of various generalizations of Lindley distribution are discussed and the distinguishable roles of DUS transformation is also discussed

math.ST