Point-Contact Spectroscopy in MgB_2: from Fundamental Physics to Thin-Film Characterization
In this paper we highlight the advantages of using point-contact spectroscopy (PCS) in multigap superconductors like MgB_2, both as a fundamental research tool and as a non-destructive diagnostic technique for the optimization of thin-film characteristics. We first present some results of crucial fundamental interest obtained by directional PCS in MgB_2 single crystals, for example the temperature dependence of the gaps and of the critical fields and the effect of a magnetic field on the gap amplitudes. Then, we show how PCS can provide useful information about the surface properties of MgB_2 thin films (e.g. Tc, gap amplitude(s), clean or dirty-limit conditions) in view of their optimization for the fabrication of tunnel and Josephson junctions for applications in superconducting electronics.