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Vijay Chouhan

Publications and source records attributed to Vijay Chouhan.

2 recordsLinked to original sources

Cryogenic RF characterization of the MAGO cavity for high-frequency gravitational-wave detection

Superconducting radio-frequency (SRF) cavities are promising resonant sensors for gravitational-wave detection in the kHz-MHz frequency range. We report the cryogenic RF characterization of a prototype superconducting niobium cavity with an unconventional geometry designed for narrow electromagnetic mode separation. Following an adapted surface preparation procedure, cryogenic tests were performed at Fermilab and DESY at temperatures down to 2\,K. Mechanical tuning at room temperature achieved a mode splitting of approximately 11\,kHz at cryogenic temperature. High electromagnetic quality factors consistent with previous prototype cavities were measured. The measurements further revealed phase transfer characteristics relevant for stable low-level RF control as well as indications of mode coupling potentially caused by one-point multipacting. In addition, first cryogenic measurements of the mechanical eigenmodes yielded mechanical quality factors significantly below commonly assumed theoretical values. These results demonstrate the successful application of established SRF preparation and characterization techniques to a non-standard resonator geometry and provide important experimental input for the development of future SRF-based gravitational-wave detectors.

physics.ins-det

Analysis of Niobium Electropolishing Using a Generalized Distribution of Relaxation Times Method

Using electrochemical impedance spectroscopy, we have devised a method of sensing the microscopic surface conditions on the surface of niobium as it is undergoing an electrochemical polishing (EP) treatment. The method uses electrochemical impedance spectroscopy (EIS) to gather information on the surface state of the electrode without disrupting the polishing reaction. The EIS data is analyzed using a so-called distribution of relaxation times (DRT) method. Using DRT, the EIS data can be deconvolved into discrete relaxation time peaks without any a priori knowledge of the electrode dynamics. By analyzing the relaxation time peaks, we are able to distinguish two distinct modes of the EP reaction. As the polishing voltage is increased, the electrode transitions from the low voltage EP mode, characterized by a single relaxation time peaks, to the high voltage EP mode, characterized by two relaxation time peaks. We theorize that this second peak is caused by the formation of an oxide layer on the electrode. We also find that this oxide induced peak transitions from to a negative relaxation time, which is indicative of a blocking electrode process. By analyzing EPed samples, we show that samples polished in the low voltage mode have significantly higher surface roughness due to grain etching and faceting. We find that the surface roughness of the samples only improves when the oxide film peak is present and in the negative relaxation time region. This shows that EIS combined with DRT analysis can be used to predict etching on EPed Nb. This method can also be performed before or during the EP, which could allow for adjustment of polishing parameters to guarantee a smooth cavity surface finish.

cond-mat.mtrl-sci