SearcharxivSearch

arXiv subjects

Vishal Ganesan

Publications and source records attributed to Vishal Ganesan.

2 recordsLinked to original sources

Comparison of Two-Level System Microwave Losses in Pure Bulk Microcrystalline Nb2O5 and NbO2 Oxide Samples

Losses from two-level systems (TLS) associated with amorphous oxides remain one of the primary limitations to the performance of superconducting qubits and microwave cavities. Niobium resonators are widely used in quantum science experiments, yet niobium's natural oxide layer contains various types of oxides whose relative contributions to TLS loss have not been clearly distinguished. Here, we use a superconducting 3D microwave cavity to measure commercial 99.9\% trace metal pure, microcrystalline oxide powders \ch{Nb2O5} and \ch{NbO2} in bulk amounts. Using this approach, we directly compare the loss characteristics of \ch{Nb2O5} and \ch{NbO2}. Our measurements show that the nominal \ch{Nb2O5} bulk oxide powder samples exhibit losses which have the power and temperature behavior expected for TLS. Moreover, the measurements agree with existing theoretical models. Analogous measurements performed on \ch{NbO2} bulk powder samples do not show any detectable TLS loss signatures. Based on our results we propose that the TLS losses might be reduced if a high quality microcrystalline \ch{NbO2} oxide dominates the \ch{Nb2O5} oxide in practical Nb cavities. These results establish a materials based strategy for isolating oxide specific TLS losses and provide a reference measurement for niobium oxide phases relevant to superconducting quantum devices.

cond-mat.supr-con

Quantitative Measurements of Nanoscale Permittivity and Conductivity Using Tuning-fork-based Microwave Impedance Microscopy

We report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated $MoS_2$ field effect transistors and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.

physics.app-ph