SearcharxivSearch

arXiv subjects

Walter R. Cook

Publications and source records attributed to Walter R. Cook.

6 recordsLinked to original sources

Tracing the Boundary of the South Atlantic Anomaly Region with SPHEREx Transient Flagging Rates

The NASA SPHEREx satellite was launched in 03/2025 to survey the full sky between 0.75 - 5.0 um. The image processing of SPHEREx H2RG detectors includes real-time flagging of transient events during integration. SPHEREx follows a polar orbit passing over the South Atlantic Anomaly (SAA) zone multiple times daily, where the transient counts reach as high as >80% of pixels, depleting the pixel inventory for further analysis. The science pipeline flags all exposures taken while in the SAA for re-observation, as well as any with >10% transients regardless of the spacecraft location. After six months, ~1.5% of the exposures outside of the pre-defined SAA zone were flagged. While some exposures are adjacent to the edge of the SAA, the majority appear to trace the geomagnetic field near the poles. Given the importance of the SAA to designing and operating space instruments, in this paper we present the SAA boundary traced by SPHEREx transient flags as a reference for future mission.

astro-ph.IM

The SPHEREx Instrument: Calibration, testing and performance measurements of the NIR 2 spectroscopic surveyor from the laboratory to in-orbit commissioning

The SPHEREx near-infrared space telescope is an all-sky spectroscopic survey mission launched on March 12th, 2025 UTC. In addition to providing the community with a spectral database applicable to a wide range of investigations, it is optimized to address three core science goals: to survey the large scale structure of the Universe for signatures of non-Gaussianity during inflation; to conduct intensity mapping studies of the extragalactic background light for probing the history of galaxy evolution; and to survey the plane of the Milky Way for the prevalence and distribution of water and other biogenic ices. Each of these science goals imposes unique requirements on the performance of the instrument. We detail the design and testing strategies and report the performance results for the full instrument test campaign, ranging from component-level screening to in-orbit tests during the commissioning phase. The instrument, currently operating in full science survey mode, meets all of its driving requirements including optical performance, point source sensitivity, thermal stability and correlated noise minimization.

astro-ph.IM

The SPHEREx Satellite Mission

SPHEREx, a NASA explorer satellite launched on 11 March 2025, is carrying out the first all-sky near-infrared spectral survey. The satellite observes in 102 spectral bands from 0.75 to 5.0 um with a resolving power ranging from 35 to 130 in 6.2 arcsecond pixels. The observatory obtains a 5-sigma depth of 19.5 - 19.9 AB mag for 0.75 to 3.8 um and 17.8 - 18.8 AB mag for 3.8 to 5.0 um after mapping the full sky four times over two years. Scientifically, SPHEREx will produce a large galaxy redshift survey over the full sky, intended to constrain the amplitude of inflationary non-Gaussianity. The observations will produce two deep spectral maps near the ecliptic poles that will use intensity mapping to probe the evolution of galaxies over cosmic history. By mapping the depth of infrared absorption features over the Galactic plane, SPHEREx will comprehensively survey the abundance and composition of water and other biogenic ice species in the interstellar medium. The initial data are rapidly released in the form of spectral images to the public. The project will release specialized data products over the life of the mission as the surveys proceed. The science team will also produce specialized spectral catalogs on planet-bearing and low-mass stars, solar system objects, and galaxy clusters 3 years after launch. We describe the design of the instrument and spacecraft, which flow from the core science requirements. Finally, we present an initial evaluation of the in-flight performance and key characteristics.

astro-ph.IM

ProtoEXIST: Advanced Prototype CZT Coded Aperture Telescopes for EXIST

{\it ProtoEXIST1} is a pathfinder for the {\it EXIST-HET}, a coded aperture hard X-ray telescope with a 4.5 m$^2$ CZT detector plane a 90$\times$70 degree field of view to be flown as the primary instrument on the {\it EXIST} mission and is intended to monitor the full sky every 3 h in an effort to locate GRBs and other high energy transients. {\it ProtoEXIST1} consists of a 256 cm$^2$ tiled CZT detector plane containing 4096 pixels composed of an 8$\times$8 array of individual 1.95 cm $\times$ 1.95 cm $\times$ 0.5 cm CZT detector modules each with a 8 $\times$ 8 pixilated anode configured as a coded aperture telescope with a fully coded $10^\circ\times10^\circ$ field of view employing passive side shielding and an active CsI anti-coincidence rear shield, recently completed its maiden flight out of Ft. Sumner, NM on the 9th of October 2009. During the duration of its 6 hour flight on-board calibration of the detector plane was carried out utilizing a single tagged 198.8 nCi Am-241 source along with the simultaneous measurement of the background spectrum and an observation of Cygnus X-1. Here we recount the events of the flight and report on the detector performance in a near space environment. We also briefly discuss {\it ProtoEXIST2}: the next stage of detector development which employs the {\it NuSTAR} ASIC enabling finer (32$\times$32) anode pixilation. When completed {\it ProtoEXIST2} will consist of a 256 cm$^2$ tiled array and be flown simultaneously with the ProtoEXIST1 telescope.

astro-ph.IM

Effects of Bulk and Surface Conductivity on the Performance of CdZnTe Pixel Detectors

We studied the effects of bulk and surface conductivity on the performance of high-resistivity CdZnTe (CZT) pixel detectors with Pt contacts. We emphasize the difference in mechanisms of the bulk and surface conductivity as indicated by their different temperature behaviors. In addition, the existence of a thin (10-100 A) oxide layer on the surface of CZT, formed during the fabrication process, affects both bulk and surface leakage currents. We demonstrate that the measured I-V dependencies of bulk current can be explained by considering the CZT detector as a metal-semiconductor-metal system with two back-to-back Schottky-barrier contacts. The high surface leakage current is apparently due to the presence of a low-resistivity surface layer that has characteristics which differ considerably from those of the bulk material. This surface layer has a profound effect on the charge collection efficiency in detectors with multi-contact geometry; some fraction of the electric field lines originated on the cathode intersects the surface areas between the pixel contacts where the charge produced by an ionizing particle gets trapped. To overcome this effect we place a grid of thin electrodes between the pixel contacts; when the grid is negatively biased, the strong electric field in the gaps between the pixels forces the electrons landing on the surface to move toward the contacts, preventing the charge loss. We have investigated these effects by using CZT pixel detectors indium bump bonded to a custom-built VLSI readout chip.

physics.ins-det

Properties of Pt Schottky Type Contacts On High-Resistivity CdZnTe Detectors

In this paper we present studies of the I-V characteristics of CdZnTe detectors with Pt contacts fabricated from high-resistivity single crystals grown by the high-pressure Brigman process. We have analyzed the experimental I-V curves using a model that approximates the CZT detector as a system consisting of a reversed Schottky contact in series with the bulk resistance. Least square fits to the experimental data yield 0.78-0.79 eV for the Pt-CZT Schottky barrier height, and <20 V for the voltage required to deplete a 2 mm thick CZT detector. We demonstrate that at high bias the thermionic current over the Schottky barrier, the height of which is reduced due to an interfacial layer between the contact and CZT material, controls the leakage current of the detectors. In many cases the dark current is not determined by the resistivity of the bulk material, but rather the properties of the contacts; namely by the interfacial layer between the contact and CZT material.

physics.ins-det