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Weiwei Tan

Publications and source records attributed to Weiwei Tan.

4 recordsLinked to original sources

Cross-Branch Conflict as a Shield: Safeguarding Facial Identities in Unified Multimodal Image Editing

Unified multimodal models (UMMs) have recently demonstrated powerful instruction-based image editing capabilities, while also raising serious concerns about the unauthorized manipulation of personal portraits. We investigate a novel and practical problem: protecting facial identities against unauthorized editing of UMMs. Existing diffusion-based and VLM-based protection methods often become ineffective because they typically disrupt only a single visual branch. To understand this limitation, we conduct a feature-level analysis of the understanding and generation branches in unified image editing models. Our observations show that the structural agreement between these two branches is closely related to successful image editing. When only one branch is distorted, the model may still recover identity information from the other branch. Based on this, we propose Cross-Branch Conflict as a Shield (CCS), a unified adversarial protection framework. CCS jointly drives the ViT and VAE representations away from their clean counterparts. It also uses a linear Centered Kernel Alignment (CKA) objective to disrupt the structural consistency between the two branches. By degrading reliable identity information in both visual pathways and inducing incompatible cross-branch representations, CCS effectively prevents UMMs from recovering consistent facial identity cues during editing. Extensive experiments suggest that CCS consistently provides stronger protection in suppressing identity-preserving edits. Codes are in the supplementary material.

cs.CV

Magnetic properties and hydrides precipitation observation of nitrogen doping niobium used for accelerator applications

Nitrogen doping study on niobium (Nb) samples used for the fabrication of the superconducting radio frequency (SRF) cavities has been carried out. The samples' surface treatment was attempted to replicate that of the SRF cavities, which includes heavy electropolishing (EP), nitrogen doping and the subsequent EP with different amounts of material removal. The magnetization curves of both the doped and the un-doped samples have been measured, from which the field of the first flux penetration and the upper critical field were extracted. The thermodynamic critical field, the the Ginzburg-Landau parameter, the penetration depth, the coherence length and the superheating field were calculated from the determined reversible magnetization curves. The superheating field of the doped samples is obviously smaller than that of the un-doped samples. Direct observation of hydrides precipitation on both the doped and the un-doped samples has been carried out using Scanning Electron Microscope (SEM) with a cold stand at 80K, which showed that the amount of hydrides precipitation on the doped samples was reduced to varying degrees with different amounts of material removal. Under our doping recipe, the doped sample with subsequent EP material removal of 7-9 microns corresponds to the minimum nitrogen concentration that can effectively reduce the amounts of hydrides precipitation.

physics.acc-ph

XPS studies of nitrogen doping niobium used for accelerator applications

Nitrogen doping study on niobium (Nb) samples used for the fabrication of superconducting radio frequency (SRF) cavities was carried out. The samples' surface treatment was attempted to replicate that of the Nb SRF cavities, which includes heavy electropolishing (EP), nitrogen doping and the subsequent EP with different amounts of material removal. The surface chemical composition of Nb samples with different post treatments has been studied by XPS. The chemical composition of Nb, O, C and N was presented before and after Gas Cluster Ion Beam (GCIB) etching. No signals of poorly superconducting nitrides NbNx was found on the surface of any doped Nb sample with the 2/6 recipe before GCIB etching. However, in the depth range greater than 30nm, the content of N element is below the XPS detection precision scope even for the Nb sample directly after nitrogen doping treatment with the 2/6 recipe.

physics.acc-ph

Plasma cleaning: A new possible treatment for niobium superconducting cavity after nitrogen doping

Nitrogen doping treatment with the subsequent electropolishing (EP) of the niobium superconducting cavity can significantly increase the cavity's quality factor up to a factor of 3. But the process of the EP removal may reintroduce hydrogen in the cavity surface, which may influence the cavity's radio frequency performance. Plasma cleaning study on niobium samples with gas mixtures of argon and oxgen intended to remove contaminations (hydrocarbons and micronicdust particles) from cavity surface to avoid field emission, was performed in Peking University. The niobium samples have been analyzed using the time of flight secondary ion mass spectrometry (TOF-SIMS) to measure the depth profiles of H, C, O, F, P and Nb. The measuring results show that the plasma cleaning with gas mixtures of argon and oxgen and conditions of about 20Pa and 100W can remarkably reduce the contents of impurity elements in the depth of about 30 nm without introducing hydrogen in the cavity surface. So plasma cleaning has been proposed to be a new possible treatment for niobium superconducting cavity after nitrogen doping.

physics.acc-ph